Specifications

21
Applications
Material measurements
□ 85070E High-Temperature Dielectric Probe Kit
The 85070E enables measurements of the dielectric properties
of materials quickly and conveniently. Measurements made
with this probe are nondestructive and require no sample
preparation. The dielectric probe is well suited for measurements
of liquid, semisolid and flat solid materials. Measurement
results can be viewed in a variety of formats (ε’
r
, ε”
r
, tan δ
or Cole-Cole). The supplied software can be run in the PNA
analyzer or on a PC.
□ 85071E Materials Measurement Software
The 85071E materials measurement software calculates the
permittivity and permeability of material samples placed in a
coaxial airline or a rectangular waveguide. The measurement
technique works well for solid materials that can be machined
to fit precisely inside a transmission line. Measurement
results can be viewed in a variety of formats (ε’
r
, ε
r
, µ’
r
, µ”
r
, tan δ,
or Cole-Cole µ). The software can be run in the PNA analyzer
or on a PC.
Signal integrity measurements
□ N1930B Physical Layer Test System (PLTS) Software
The PLTS software platform has become an industry standard
for calibration, measurement and analysis of linear passive
interconnects such as cables, connectors, backplanes and printed
circuit boards. Utilizing either a vector network analyzer (VNA)
or a time domain reflectometer (TDR), fast and accurate mea-
surements can be obtained without in-depth knowledge of
microwave measurement techniques. Refer to www.agilent.
com/find/plts or the technical overview, literature number
5989-6841EN for more details.
Multiport measurements
The multiport test sets are designed to work with the PNA Family
of network analyzers and provide network analysis with a single
set of connections for devices that have multiple ports. The
test sets are configured in a variety of ways, for extension or
switching, electro-mechanical or solid-state switches, number of
test ports, frequency range, and 2- or 4-ports depending on your
analyzer.
Test set types–extension and switching test sets
Switching test sets provide an economical solution for RF applica-
tions. This test set is connected to the test ports of the VNA, and
group of test ports share the directional couplers and receivers in
the VNA. An extension test set is connected to the sources and
test receivers through configurable test set of the VNA. It features
a directional coupler for every test port and all switching occurs
behind the directional couplers, which provides the ultimate
in flexibility, stability, and performance for RF and microwave
applications.
Switch types – electro-mechanical and solid-
state switches
The electro-mechanical switches have less insertion loss, higher
power handling, and linear responses. Thus it is recommended
for testing active devices, high-power devices, and devices that
require wide dynamic range. However, they have limited switching
life (mostly 5 million cycles) and long setting time. On the other
hand, the solid-state switches have unlimited switching life, very
fast switching speed and excellent repeatability thus they are
often used for high volume passive device tests, and S-parameter
measurements of passive components can be performed.
Test set model number
Multiport test set model numbers represent the test set types,
note the numbering scheme below.
Note that there are some test sets that do not follow this numbering scheme such as U3022AE10, U3025AE06, and U3025AE10, which use
solid-state switches, and U3022AS66, which includes 1x6 switching test set and six calibration distribution ports.