User`s manual

5 SPECIFICATIONS
Microscope fi-ame
[Upright]
BX50-FLA-FVX
BXWI-FLA-FVX
[Inclined]
IX70-FLA-FVX
Stand for BX
Computer system
Power controller
Z-motor
Computer desk
Stand for BX
Anti-vibration table
forBX
Anti-vibration table
for IX, BXWI
Options
Microscope ft-ame
Trinocular
observation tube
light path selection
Objective
Microscope ft-ame
Objective
Computer
Monitor
Magneto-optical disk
No. of outlets
Capacity
Dimensions (mm)
Dimensions (mm)
Anti-vibration system
Dimensions (mm)
Anti-vibration system
Dimensions (mm)
Piezoelectric Z-stage
Transmitted light
detector
Objective
micrometer
Green HeNe laser
unit
Rubber feet anti-
vibration table for IX
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BX50, BXWI
2 settings (100% for binocular eyepieces; 100% for LSM)
UIS series
IX70-FVX-F, IX70-FVXPZ-F
UIS series
Scan unit, for support
Specially designed for BX microscopes
IBM PC-AT compatible, Windows 3.11 (English)
17"
230 MB
6 / JP (not usable for the laser power supply unit, reflected light
module power supply)
100V 15A (MAX)
Microscope fine adjustment knob axis. One full tum: 100 nm
Minimum resolution: 0,1 nm*
650 (W) X 700 (D) x 670 (H)
800 (W) x 700 (D) X 670 (H)
Rubber feet
790 (W) X 667 (D) x 73 (H)
Air
1000 (W)x 700 (D)x 750(H)
Cross-control by extemal sensor
Stroke: 100 nm
Minimum resolution: 0.1 nm
Position reproducibility: ± 0.2 nm
2 light path settings; transmitted detection/transmitted illumination
Connected to the scan unit via optical fiber connection.
1 mm 100 degrees, for reflected light
Random polarization 1.5 mW (543 nm)
Direct connection, ND filter tunet provided
1000 (W) X 680 (D) x 73 (H) (mm)
5-2