Datasheet

AD9761
–4–
AD9761
–5–
CAUTION
ESD (electrostatic discharge) sensitive device. Electrostatic charges as high as 4000 V readily accumulate on
the human body and test equipment and can discharge without detection. Although the AD9761 features
proprietary ESD protection circuitry, permanent damage may occur on devices subjected to high energy
electrostatic discharges. Therefore, proper ESD precautions are recommended to avoid performance
degradation or loss of functionality.
ORDERING GUIDE
Package Package
Model Description Option
AD9761ARS 28-Lead Shrink Small Outline (SSOP) RS-28
AD9761ARSRL 28-Lead Shrink Small Outline (SSOP) RS-28
AD9761-EB Evaluation Board
THERMAL CHARACTERISTICS
Thermal Resistance
28-Lead SSOP
q
JA
= 109°C/W
COMP1
I
DAC
FSADJ
IOUTA
IOUTB
WRITE
SELECT
COMP2 AVDD AVSS
AD9761
2x
LATCH
I
REFLO
Q
DAC
QOUTA
QOUTB2x
LATCH
Q
MUX
CONTROL
COMP3
DB9–DB0
SLEEPCLOCK
REFIO
100
50
20pF
50
20pF
DIGITAL
DATA
TEKTRONIX
AWG-2021
CLOCK
OUT
MARKER 1
RETIMED
CLOCK
OUTPUT*
LE CROY 9210
PULSE GENERATOR
*AWG2021 CLOCK RETIMED SUCH THAT DIGITAL DATA
TRANSITIONS ON FALLING EDGE OF 50% DUTY CYCLE CLOCK.
MINI-CIRCUITS
T1-1T
R
SET
2k
0.1F
TO HP3589A
SPECTRUM/NETWOR
K
ANALYZER
50 INPUT
100
50
20pF
50
20pF
MINI-CIRCUITS
T1-1T
TO HP3589A
SPECTRUM/NETWOR
K
ANALYZER
50 INPUT
0.1F 0.1F0.1F
DVDD DCOM
2.7V TO
5.5V
3V TO
5.5V
Figure 3. Basic AC Characterization Test Setup
ABSOLUTE MAXIMUM RATINGS*
With
Parameter Respect to Min Max Unit
AVDD ACOM –0.3 +6.5 V
DVDD DCOM –0.3 +6.5 V
ACOM DCOM –0.3 +0.3 V
AVDD DVDD –6.5 +6.5 V
CLOCK, WRITE DCOM –0.3 DVDD + 0.3 V
SELECT, SLEEP DCOM –0.3 DVDD + 0.3 V
Digital Inputs DCOM –0.3 DVDD + 0.3 V
IOUTA, IOUTB ACOM –1.0 AVDD + 0.3 V
QOUTA, QOUTB ACOM –1.0 AVDD + 0.3 V
COMP1, COMP2 ACOM –0.3 AVDD + 0.3 V
COMP3 ACOM –0.3 AVDD + 0.3 V
REFIO, FSADJ ACOM –0.3 AVDD + 0.3 V
REFLO ACOM –0.3 +0.3 V
Junction Temperature 150 °C
Storage Temperature –65 +150 °C
Lead Temperature (10 sec) 300 °C
*Stresses above those listed under Absolute Maximum Ratings may cause permanent damage to the device. This
is a stress rating only; functional operation of the device at these or any other conditions above those indicated in
the operational sections of this specication is not implied. Exposure to absolute maximum ratings for extended
periods may affect device reliability.
REV. C
REV. C