Datasheet

Data Sheet ADG824
Rev. C | Page 3 of 16
SPECIFICATIONS
V
DD
= 2.7 V to 3.6 V, GND = 0 V, unless otherwise noted.
Table 1.
Parameter +25°C −40°C to +85°C Unit Test Conditions/Comments
ANALOG SWITCH
Analog Signal Range 0 to V
DD
V
On Resistance, R
ON
0.5 Ω typ V
DD
= 2.7 V, V
S
= 0 V to V
DD
, I
DS
= 100 mA; see Figure 19
0.8 0.85 Ω max
On Resistance Match Between 0.003 Ω typ V
DD
= 2.7 V, V
S
= 0.65 V, I
DS
= 100 mA
Channels, ∆R
ON
0.04 Ω max
On Resistance Flatness, R
FLAT (ON)
0.13 Ω typ V
DD
= 2.7 V, V
S
= 0 V to V
DD
, I
DS
= 100 mA
0.2 Ω max
LEAKAGE CURRENTS V
DD
= 3.6 V
Source Off Leakage, I
S
(Off)
±0.2
nA typ
V
S
= 0.6 V/3.3 V, V
D
= 3.3 V/0.6 V; see Figure 20
Channel On Leakage, I
D
, I
S
(On) ±0.2 nA typ V
S
= V
D
= 0.6 V or 3.3 V; see Figure 21
DIGITAL INPUTS
Input High Voltage, V
INH
1.35
V min
Input Low Voltage, V
INL
0.8 V max
Input Current
I
INL
or I
INH
0.005 µA typ V
IN
= V
GND
or V
DD
±0.1 µA max V
IN
= V
GND
or V
DD
Digital Input Capacitance, C
IN
2.7 pF typ
DYNAMIC CHARACTERISTICS
1
t
ON
7 ns typ R
L
= 50 Ω, C
L
= 35 pF
9.5 10.8 ns max V
S
= 2 V/0 V; see Figure 22
t
OFF
6 ns typ R
L
= 50 Ω, C
L
= 35 pF
7.7 8.6 ns max V
S
= 2 V; see Figure 22
Break-Before-Make Time Delay, t
BBM
3.5 ns typ R
L
= 50 Ω, C
L
= 35 pF
2 ns min V
S1
= V
S2
= 2 V; see Figure 23
Charge Injection, Q
INJ
27 pC typ V
S
= 1.5 V, R
S
= 0 Ω, C
L
= 1 nF; see Figure 24
Off Isolation
−71
dB typ
R
L
= 50 Ω, C
L
= 5 pF, f = 100 kHz; see Figure 25
Channel-to-Channel Crosstalk −90 dB typ
S1A to S2A/S1B to S2B, R
L
= 50 Ω, C
L
= 5 pF, f = 100 kHz;
see Figure 26
−67 dB typ
S1A to S1B/S2A to S2B, R
L
= 50 Ω, C
L
= 5 pF, f = 100 kHz;
see Figure 27
Total Harmonic Distortion, THD + N 0.06 % R
L
= 33 Ω, f = 20 Hz to 20 kHz, V
S
= 2 V p-p
Insertion Loss −0.05 dB typ R
L
= 50 Ω, C
L
= 5 pF; see Figure 28
−3 dB Bandwidth 90 MHz typ R
L
= 50 Ω, C
L
= 5 pF; see Figure 28
C
S
(Off) 25 pF typ
C
D
, C
S
(On) 58 pF typ
POWER REQUIREMENTS V
DD
= 3.6 V
I
DD
0.003 µA typ Digital inputs = 0 V or 3.6 V
1 µA max
1
Guaranteed by design; not subject to production test.