Datasheet
ADSP-BF531/ADSP-BF532/ADSP-BF533
Rev. I | Page 25 of 64 | August 2013
ABSOLUTE MAXIMUM RATINGS
Stresses greater than those listed in Table 18 may cause perma-
nent damage to the device. These are stress ratings only.
Functional operation of the device at these or any other condi-
tions greater than those indicated in the operational sections of
this specification is not implied. Exposure to absolute maximum
rating conditions for extended periods can affect device
reliability.
ESD SENSITIVITY
Table 18. Absolute Maximum Ratings
Parameter Rating
Internal (Core) Supply Voltage (V
DDINT
) –0.3 V to +1.45 V
External (I/O) Supply Voltage (V
DDEXT
)–0.5 V to +3.8 V
Input Voltage
1,
2
1
Applies to 100% transient duty cycle. For other duty cycles see Table 19.
2
Applies only when V
DDEXT
is within specifications. When V
DDEXT
is outside speci-
fications, the range is V
DDEXT
0.2 V.
–0.5 V to +3.8 V
Output Voltage Swing –0.5 V to V
DDEXT
+ 0.5 V
Storage Temperature Range –65°C to +150°C
Junction Temperature While Biased 125°C
Table 19. Maximum Duty Cycle for Input Transient Voltage
1
1
Applies to all signal pins with the exception of CLKIN, XTAL, VROUT1–0.
V
IN
Min (V)
2
V
IN
Max (V)
2
2
The individual values cannot be combined for analysis of a single instance of
overshoot or undershoot. The worst case observed value must fall within one of
the voltages specified and the total duration of the overshoot or undershoot
(exceeding the 100% case) must be less than or equal to the corresponding
duty cycle.
Maximum Duty Cycle
3
3
Duty cycle refers to the percentage of time the signal exceeds the value for the
100% case. This is equivalent to the measured duration of a single instance of
overshoot or undershoot as a percentage of the period of occurrence.
–0.50 +3.80 100%
–0.70 +4.00 40%
–0.80 +4.10 25%
–0.90 +4.20 15%
–1.00 +4.30 10%
ESD
(electrostatic discharge) sensitive device.
Charged devices and circuit boards can discharge
without detection. Although this product features
patented or proprietary protection circuitry, damage
may occur on devices subjected to high energy ESD.
Therefore, proper ESD precautions should be taken to
avoid
performance
degradation or loss of functionality.