User Manual

DATA SHEET > UCS 500N5 > 20131118
TECHNICAL DETAILS
ELECTRICAL FAST TRANSIENTS
BURST MODULE, EFT/N5
As per EN/IEC 61000-4-4 and
EN 61000-6-1, -6-2
Test voltage 200V - 5,500V ± 10%;
100V - 2,750V ± 10% into 50ohm
Pulse shape 5/50ns into 50ohm and 1,000ohm
Rise time tr 5ns ± 30% into 50ohm;
5ns ± 30% into 1,000ohm
Pulse width td 50ns ± 30% into 50ohm;
50ns -15/+100ns into 1,000ohm
Source impedance 50ohm
Polarity Positive/negative
TRIGGER CIRCUIT
Trigger of bursts Automatic, manual, external
Synchronization 0° - 360°, resolution 1° (16 - 500Hz)
Burst duration td = 0.10ms - 999ms
Repetition rate tr = 10ms - 9,999ms
Spike frequency f = 0.1kHz - 1,000kHz
Test duration T = 0:01min - 99:59min
T > 99:59min --> endless
OUTPUTS
Direct Via 50ohm coaxial connector
Coupling mode L, N, PE; all combinations
DUT supply AC: 300V/16A; 50/60Hz
DC: 300V/16A
CRO trigger 5V trigger signal for oscilloscope
TEST ROUTINES
Quick Start On-line adjustable parameters,
easy-to-use
Standard Test
routines
As per IEC 61000-4-4, Levels 1 - 4
As per EN 61000-6-1, -6-2
Manual Standard Test routine
User Test routines Synchronous burst release
Random burst release
Change voltage after T
Frequency sweep within one burst
Frequency sweep with constant
number of pulses
Frequency sweep with constant
burst duration
Change polarity after T
OPTIONS
HFK Capacitive coupling clamp as per
IEC 61000-4-4
KW50 100:1 divider, 50ohm
KW1000 500:1 divider, 1,000ohm
CA EFT kit Kit for burst pulse verification
consisting of KW50, KW1000 and
adapter for DUT port in a plastic case
for storage
A6dB 6dB attenuator, 50ohm
ITP Immunity test probes (electrical field
generation)
ITP/H Immunity test probe (magnetic field
generation)
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