Specifications

 RELIABILITY TEST CONDITIONS
No. Test Item Test Condition Inspection after test
1 High Temperature Storage
802/200 hours
2 Low Temperature Storage
-302/200 hours
3 High Temperature Operating
702/120 hours
4 Low Temperature Operating
-202/120 hours
5 Temperature Cycle storage
-202~25~70210cycles
(30min.) (5min.) (30min.)
6 Damp proof Test operating
50590%RH/120 hours
7 Vibration Test
Frequency10Hz~55Hz~10Hz
Amplitude1.5mm, XYZ direction
for total 3hours
(Packing condition)
8 Dropping test
Drop to the ground from 1m height,
one time, every side of carton.
(Packing condition)
9 ESD test
Voltage:±8KV R: 330Ω C: 150pF
Air discharge, 10time
Inspection after
2~4hours storage at
room temperature, the
sample shall be free from
defects:
1.Air bubble in the LCD;
2.Sealleak;
3.Non-display;
4.missing segments;
5.Glass crack;
6.Current Idd is twice
higher than initial value.
Remark:
1.The test samples should be applied to only one test item.
2.Sample size for each test item is 5~10pcs.
3.For Damp Proof Test, Pure water(Resistance10MΩ) should be used.
4.In case of malfunction defect caused by ESD damage, if it would be recovered to normal state after
resetting, it would be judged as a good part.
5.EL evaluation should be excepted from reliability test with humidity and temperature: Some defects
such as black spot/blemish can happen by natural chemical reaction with humidity and Fluorescence EL
has.
6.Failure Judgment Criterion: Basic Specification, Electrical Characteristic, Mechanical Characteristic,
Optical Characteristic.
P.10
MULTI-INNO TECHNOLOGY CO.,LTD.
MODULE NO.: MI12864J-G-1
Ver 1.0