User Manual

CHAPTER 3. OPERATION 26
3.9 BIN Function
The bin comparator function allows for sorting, comparison against preset limits, and pass/fail testing of
components. A total of 9 bins are available, each with high and low limits for both primary and secondary
measurements.
To use the bin function:
1. Select the primary and secondary measurement parameters for the test. See Section 3.8, Measurement
Setup for details.
2. Setup the bin parameters from the BIN Setup display.
3. Navigate to the BIN Display to start using this function.
3.9.1 BIN Display
The BIN comparator measurements and test results are accessed in the BIN DISP screen. To access, press the
buon, and then press the function key corresponding to BIN DISP from the so menu.
The Mode, Sound, COMP, and Load BIN parameters are configurable seings. To select, use the arrow keys,
and the keypad and so menu function keys to change them. See Table 3.10 for details.
Note: When the Trigger parameter in Measurement Setup is NOT set to INT (internal trigger),
the display will not show compare test results until a trigger is received from the selected source.
When Vm (Measured voltage display) and/or Im (Measured current display) parameters are set
to OFF in Measurement Setup, the measurement display will show OFF next to Vm: and/or Im:
below the secondary measurement.
Figure 3.13: BIN Comparator Display
3.9.2 BIN Sorting
The BIN comparator function also can sort measured values into BINs.
Go to BIN Setup, Section 3.9.5, and configure the upper and lower limits for the set of bins desired, up to 9 of
them. Set all other parameters as necessary, see Table 3.20.