Specifications

ST72104Gx, ST72215Gx, ST72216Gx, ST72254Gx
101/141
FUNCTIONAL OPERATING CONDITIONS (Cont’d)
Figure 56. High LVD Threshold Versus V
DD
and f
OSC
for ROM devices
2)
Figure 57. Medium LVD Threshold Versus V
DD
and f
OSC
for ROM devices
2)
Figure 58. Low LVD Threshold Versus V
DD
and f
OSC
for ROM devices
2)3)
Notes:
1. LVD typical data are based on T
A
=25°C. They are given only as design guidelines and are not tested.
2. The minimum V
DD
rise time rate is needed to insure a correct device power-on and LVD reset. Not tested in production.
3. If the low LVD threshold is selected, when V
DD
falls below 3.2V, the device is guaranteed to be either functioning or
under reset.
f
OSC
[MHz]
SUPPLY VOLTAGE [V]
16
8
0
2.5 3 3.5 4 4.5 5 5.5
FUNCTIONAL AREA
DEVICE UNDER
RESET
IN THIS AREA
FUNCTIONALITY
NOT GUARANTEED
IN THIS AREA
V
IT-
≥3.85
f
OSC
[MHz]
SUPPLY VOLTAGE [V]
16
8
0
2.5 3 V
IT-
≥3.5V44.555.5
FUNCTIONAL AREA
DEVICE UNDER
RESET
IN THIS AREA
FUNCTIONALITY
NOT GUARANTEED
IN THIS AREA
f
OSC
[MHz]
SUPPLY VOLTAGE [V]
16
8
0
2.5 V
IT-
≥3.00V 3.5 4 4.5 5 5.5
FUNCTIONAL AREA
DEVICE UNDER
RESET
IN THIS AREA
FUNCTIONALITY
NOT GUARANTEED
IN THIS AREA