Specifications

ST72104Gx, ST72215Gx, ST72216Gx, ST72254Gx
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13.7 EMC CHARACTERISTICS
Susceptibility tests are performed on a sample ba-
sis during product characterization.
13.7.1 Functional EMS
(Electro Magnetic Susceptibility)
Based on a simple running application on the
product (toggling 2 LEDs through I/O ports), the
product is stressed by two electro magnetic events
until a failure occurs (indicated by the LEDs).
■ ESD: Electro-Static Discharge (positive and
negative) is applied on all pins of the device until
a functional disturbance occurs. This test
conforms with the IEC 1000-4-2 standard.
■ FTB: A Burst of Fast Transient voltage (positive
and negative) is applied to V
DD
and V
SS
through
a 100pF capacitor, until a functional disturbance
occurs. This test conforms with the IEC 1000-4-
4 standard.
A device reset allows normal operations to be re-
sumed.
Figure 70. EMC Recommended star network power supply connection
2)
Notes:
1. Data based on characterization results, not tested in production.
2. The suggested 10µF and 0.1µF decoupling capacitors on the power supply lines are proposed as a good price vs. EMC
performance tradeoff. They have to be put as close as possible to the device power supply pins. Other EMC recommen
-
dations are given in other sections (I/Os, RESET, OSCx pin characteristics).
Symbol Parameter Conditions Neg
1)
Pos
1)
Unit
V
FESD
Voltage limits to be applied on any I/O pin
to induce a functional disturbance
V
DD
=5V, T
A
=+25°C, f
OSC
=8MHz
conforms to IEC 1000-4-2
-1 1
kV
V
FFTB
Fast transient voltage burst limits to be ap-
plied through 100pF on V
DD
and V
DD
pins
to induce a functional disturbance
V
DD
=5V, T
A
=+25°C, f
OSC
=8MHz
conforms to IEC 1000-4-4
-4 4
V
DD
V
SS
0.1µF10µF
V
DD
ST72XXX
V
SSA
V
DDA
0.1µF
POWER
SUPPLY
SOURCE
ST7
DIGITAL NOISE
FILTERING
EXTERNAL
NOISE
FILTERING