Operation Manual

08/ 2012 40 / 58

BENNING ST 750 A
13.2 Internal Test Procedures for Devices according to VDE 0701/0702 (Protection Class II)
1 x x x x
2 x x x x
3 x x x x
4 x x x
5 x x x x
6 x x x x x
Device, Class II
Device, Class II with ICont (alt.)
Device, Class II, RInsu 250 V
Device, Class II without RInsu
Device, Class II without RInsu + ICont
Device, Class II with U-output
A
ut
oma
t
i
c
T
e
s
t
No.
B
E
NNI
NG
S
T
750
A
–
B
r
i
ef
Des
c
r
i
pt
ion
V
i
s
u
a
l
I
ns
p
e
c
t
ion
C
o
nnec
t
ion
T
es
t
R
I
ns
u-
1
:
L
/
N
-
P
E
R
I
ns
u-
1
:
L
/
N
-
P
E
@
250
V
R
I
ns
u-
3
:
L/
N
-
s
ec
.
I
Cont
(
dir
.
)
I
Cont
(
alt
.
)
F
unc
t
ional
T
es
t
U
a
S
a
f
e
t
y
Ex
t
r
a
-
L
o
w
Vo
l
t
a
g
e
1
Device of Class II with RInsu (500 V), functional test with ICont (differential current
measurement),
2 Device of Class II with RInsu (500 V), ICont (alternative measurement)
3
Device of Class II with overvoltage arrester, RInsu (250 V), functional test with ICont
(differential current measurement)
4
Device of Class II without RInsu, functional test with ICont (differential current
measurement),testprocedurewithoutRInsu,onlywithjustication
5
Device of Class II without RInsu, ICont (direct measurement), functional test with ICont
(differentialcurrentmeasurement),testprocedurewithoutRInsu,onlywithjustication
6
Device of Class II with RInsu-3 (L/N – sec.), functional test with ICont (differential cur-
rent measurement), Ua at secondary output, e.g. chargers, mains supply units
13.3 Internal Test Procedures for Devices according to VDE 0701/0702 (Protection Class III)
1
x x x
Device, Class III
A
ut
oma
t
i
c
T
e
s
t
No.
B
E
NNI
NG
S
T
750
A
–
B
r
i
ef
Des
c
r
i
pt
ion
V
i
s
u
a
l
I
ns
pec
t
io
n
C
o
n
n
e
c
t
ion
T
es
t
R
I
ns
u
-
3:
L/
N
-
s
e
c
.
@
2
5
0
V
/
0.
25
M
Ω
1 Device of Class III with RInsu-3 (prim. – sec.)
13.4 Internal Test Procedures for Devices according to VDE 0751-1 (Protection Class I)
1 x x x x x x
2 x x x x x
Med. devices, Class I
Med. devices, Class I without RInsu
A
ut
oma
t
i
c
T
e
s
t
No.
B
E
NNI
NG
S
T
750
A
–
B
r
i
e
f
D
e
s
c
r
ip
t
ion
V
is
ual
I
n
s
p
ec
t
ion
C
o
nnec
t
i
on
T
es
t
R
P
E
@
200
mA
,
0.
3
ohm
s
R
I
n
s
u-
1
I
L
e
a
k
.
(
dif
f
.
)
@
0.
5
m
A
F
unc
t
ion
al
T
es
t
1 Medical devices of Class I
2 Medical devices of Class I without RInsu
13.5 Internal Test Procedures for Devices according to VDE 0751-1 (Protection Class II)
1 x x x x x
2 x x x x
Med. devices, Class II
Med. devices, Class II without RInsu
A
ut
oma
t
i
c
T
e
s
t
No.
B
E
NNI
NG
S
T
750
A
–
B
r
i
e
f
D
e
s
c
r
ip
t
ion
V
is
ual
I
n
s
p
ec
t
ion
C
o
nnec
t
i
on
T
es
t
R
P
E
@
200
mA
,
0.
3
ohm
s
R
I
n
s
u-
1
I
L
e
a
k
.
(
dif
f
.
)
@
0.
5
m
A
F
unc
t
ion
al
T
es
t
7 Medical devices of Class II
8 Medical devices of Class II without RInsu
13.6 Creating / Modifying a Test Procedure
seechapter7.4.2"CreatingTestProcedures"

Thepredenedinternaltestprocedurescannotbemodied!