User's Manual
Page8
2.4.1 Memories
The device has the following features:
Up to 8 Kbytes of embedded SRAM accessed (read/write) at CPU clock speed with 0 wait states and
featuring embedded parity checking with exception generation for fail- critical applications.
The non-volatile memory is divided into two arrays:
–
16 to 64 Kbytes of embedded Flash memory for programs and data
–
Option bytes
The option bytes are used to write-protect the memory (with 4 KB granularity) and/or readout-
protect the whole memory with the following options:
–
Level 0: no readout protection
–
Level 1: memory readout protection, the Flash memory cannot be read from or written to if either
debug features are connected or boot in RAM is selected
–
Level 2: chip readout protection, debug features (Cortex-M0 serial wire) and boot in RAM selection
disabled
2.4.2 Electrical characteristics
Parameter conditions
Unless otherwise specified, all voltages are referenced to VSS.
Minimum and maximum values
Unless otherwise specified, the minimum and maximum values are guaranteed in the worst conditions of
ambient temperature, supply voltage and frequencies by tests in production on 100% of the devices with
an ambient temperature at TA = 25 °C and TA = TAmax (given by the selected temperature range).
Data based on characterization results, design simulation and/or technology characteristics are indicated
in the table footnotes and are not tested in production. Based on characterization, the minimum and
maximum values refer to sample tests and represent the mean value plus or minus three times the
standard deviation (mean±3).
Typical values
Unless otherwise specified, typical data are based on TA = 25 °C, VDD = VDDA = 3.3 V. They are
given only as design guidelines and are not tested.
Typical ADC accuracy values are determined by characterization of a batch of samples from a standard
diffusion lot over the full temperature range, where 95% of the devices have an error less than or equal to
the value indicated (mean±2).
Typical curves
Unless otherwise specified, all typical curves are given only as design guidelines and are not tested.
Loading capacitor
The loading conditions used for pin parameter measurement are shown in (a).