Instruction Manual
503 Series Industrial Grade CompactFlash Card Product Manual v2.1Cactus Technologies
®
37
SMART Enable/Disable Attribute Autosave
5.3.
For this command to take eect, the following signature bytes must be loaded:
Sector Count – 00h or F1h
Cylinder Low – 4Fh
Cylinder High – C2h
This command is essentially a no-operation as the SMART attribute data is always available and kept
current by the device.
SMART Read Data
5.4.
For this command to take eect, the following signature bytes must be loaded:
Cylinder Low – 4Fh
Cylinder High – C2h
This command returns one sector of SMART data. The format of the returned data is as follows:
Oset Value Description
0 – 1 0010h SMART structure version
2 – 361 Attribute entries 1 to 30 (12 bytes each)
362 00h Oine data collection status (no oine data collection)
363 00h Selftest execution status (selftest completed)
364 – 365 0000h Total time to complete oine data collection
366 00h ----
367 00h Oine data collection capability (none)
368 369 0003h SMART capabilities
370 00h Error logging capability (none)
371 00h ----
372 00h Short selftest routine recommended polling time
373 00h Extended selftest routine recommended polling time
374 – 385 00h Reserved
386 – 387 0004h SMART Hyperstone structure version
388 – 391 Firmware commit counter
392 – 395 Firmware wear level threshold
396 Global wear leveling status: '0' – not active, '1' - active
397 Global bad block management status: '0' – not active, '1' - active
398 – 401 Average ash block erase count
402 – 405 Number of ash blocks involved into wear leveling
406 – 409 Number of total ECC errors during rmware initialization