Instructions

44
MYeBOX 150 - MYeBOX 1500
Instruction Manual
Table 18 (Continued):.EVA le description.
EVENT DESCRIPTION
SD_STATUS_OUT MicroSD not detected
SD_STATUS_ERROR Error accessing the MicroSD
MYeBOX_UPGRADE Firmware update
REC_STOP Stop manual logging (button or App)
REC_START Start manual logging (button or App)
EVQ_STOP Automatic or manual disabling of events or transients
EVQ_START Automatic or manual enabling of events or transients
ALARM_1_ON Alarm 1 activated
ALARM_2_ON Alarm 2 activated
ALARM_3_ON Alarm 3 activated
ALARM_4_ON Alarm 4 activated
ALARM_1_OFF Alarm 1 disabled
ALARM_2_OFF Alarm 2 disabled
ALARM_3_OFF Alarm 3 disabled
ALARM_4_OFF Alarm 4 disabled
4.8.2.2. .EVQ le
All quality events are stored in the �EVQ le. The following data are stored from each one of the
events:
Table 19: Quality event�
DATA DESCRIPTION
Event Type Overvoltage, Gap, Interruption or Transient
(13)
.
Event Date
Date the event occurred. This value is obtained with a precision of 1
cycle.
Duration of the Event Duration of the event in milliseconds.
Maximum/minimum voltage of
the Event
When an interruption or gap is produced, the minimum RM
(14)
voltage
value obtained during the event will be stored. The maximum value will
be stored in the event of an overvoltage.
Mean voltage of the event
Mean RMS
(14)
voltage value obtained during the duration of the recor-
ded event.
Voltage prior to the event
The RMS
(14)
voltage value just before the event was produced will be
stored.
Wave shape from 15 cycles of
the event
The unit stores a record of 5 cycles before it starts event detection;
once the event is detected, it continues to record another 10 cycles after
the event so it is perfectly delimited and its complete enclosure can be
shown, thereby improving its analysis.
(13)
For Transient type events, only the following data is stored: Wave shape from 15 cycles of the
event.
(14)
See “4.2.1.- QUALITY PARAMETERS”