Technical data

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Compaq HSZ80 Array Controller ACS Version 8.3 Maintenance and Service Guide
Testing the Read and Write Capabilities of a Disk Drive
Run a DILX Basic Function test to test the read and write capability of a disk drive.
During the Basic Function test, DILX runs the following four tests. (DILX repeats the
last three tests until the time that you specify in step 6 on page 4-59 expires.)
■ Write test. Writes specific patterns of data to the disk drive (see Table 4–15.)
DILX does not repeat this test.
■ Random I/O test. Simulates typical I/O activity by issuing read, write, access,
and erase commands to randomly-chosen logical block numbers (LBNs). You
can set the ratio of these commands as well as the percentage of read and write
data that are compared throughout this test. This test takes six minutes.
■ Data-transfer test. Tests throughput by starting at an LBN and transferring data
to the next LBN that has not been written to. This test takes two minutes.
■ Seek test. Stimulates head motion on the disk drive by issuing single-sector erase
and access commands. Each I/O uses a different track on each subsequent
transfer. You can set the ratio of access and erase commands. This test takes two
minutes.