SoftStore nvSRAM Specification Sheet

STK11C68-5 (SMD5962-92324)
Document Number: 001-51001 Rev. *A Page 6 of 15
Thermal Resistance
In this table, the thermal resistance parameters are listed.
[3]
Parameter Description Test Conditions 28-CDIP 28-LCC Unit
Θ
JA
Thermal Resistance
(Junction to Ambient)
Test conditions follow standard test methods and proce-
dures for measuring thermal impedance, per EIA /
JESD51.
TBD TBD °C/W
Θ
JC
Thermal Resistance
(Junction to Case)
TBD TBD °C/W
Figure 5. AC Test Loads
AC Test Conditions
5.0V
Output
30 pF
R1 480Ω
R2
255Ω
Input Pulse Levels....................................................0V to 3V
Input Rise and Fall Times (10% to 90%)...................... <
5 ns
Input and Output Timing Reference Levels.................... 1.5V
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