User`s manual

PANTERA 22M User’s Manual 9
Teledyne DALSA 03-032-20049-02
1.4 Blemish specification
PANTERA 22M camera includes an FTF4052M CCD image sensor, industrial grade.
Blemish specification is presented below.
Below table shows FTF4052M Sensor Blemish Specifications, maximum number of
blemishes permitted.
Description
IG (industrial grade)
Pixel defects
100
Cluster defects
12
Spot defects
0
Column defects
1
Row defects
0
Definition of blemishes
Pixel defect
Pixel whose signal, at nominal light (illumination at 50% of the linear range), deviates
more than ±30% from its neighbouring pixels. Pixel whose signal, in dark, deviates more
than 250mV from its neighbouring pixels.
Cluster defect
A grouping of at most 5 pixel defects within a sub-area of 3*3 pixels.
Spot defect
A grouping of more than 5 pixel defects within a sub-area of 3*3 pixels.
Column defect
A column which has more than 8 pixel defects in a 1*12 kernel.
Column defects must be horizontally separated by 3 good columns.
Row defect
A horizontal grouping of more than 8 pixel defects between at least 2 good pixels on both
sides, where single good pixels between 2 defective pixels are considered as defective.
Test conditions
Temperature: 60°C
Integration Time: 100ms