User manual

Index
© National Instruments Corporation I-5 NI-DAQ User Manual for PC Compatibles
building block 4: cleaning up, 3-31
DAQCard-500/700, 516 devices, and
LPM device counter/timer signals, 3-25
double-buffered data acquisition,
3-31 to 3-32
external multiplexer support
(AMUX-64T), 3-25
Lab and 1200 device counter/timer
signals, 3-24
data acquisition functions
high-level data acquisition
functions, 3-20 to 3-21
DAQ_Op, 3-20
DAQ_to_Disk, 3-20
Lab_ISCAN_Op, 3-20
Lab_ISCAN_to_Disk, 3-20
SCAN_Op, 3-21
SCAN_to_Disk, 3-21
low-level data acquisition
functions, 3-21 to 3-23
DAQ_Check, 3-21
DAQ_Clear, 3-21
DAQ_Config, 3-21
DAQ_Monitor, 3-21
DAQ_Rate, 3-22
DAQ_Set_clock, 3-22
DAQ_Start, 3-22
DAQ_StopTrigger_Config, 3-22
DAQ_VScale, 3-22
Lab_ISCAN_Check, 3-22
Lab_ISCAN_Start, 3-22
SCAN_Demux, 3-22
SCAN_Sequence_Demux,
3-22 to 3-23, 3-33
SCAN_Sequence_Retrieve,
3-23, 3-33
SCAN_Sequence_Setup, 3-23, 3-33
SCAN_Setup, 3-23
SCAN_Start, 3-23
low-level double-buffered data
acquisition functions, 3-23 to 3-24
DAQ_DB_Config, 3-23, 4-10
DAQ_DB_HalfReady, 3-24, 4-12
DAQ_DB_Transfer, 3-24, 4-11
multirate scanning, 3-32 to 3-34
data acquisition rates, SCXI
modules, 3-124 to 3-126
device configuration
NI-DAQ hardware support
(tables), 1-4 to 1-6
using Measurement & Automation
Explorer, 1-7
devices. See also specific device, e.g.,
AT-AO-6/10.
MIO and AI device terminology
(table), xv-xvii
reference voltages for analog output
devices (tables), 3-49 to 3-50
DIG_Block_Check function, 3-58
DIG_Block_Clear function, 3-58
DIG_Block_In function, 3-58
DIG_Block_Out function, 3-58
DIG_Block_PG_Config function, 3-58
DIG_Change_Message_Config function, 3-60
DIG_Change_Message_Control
function, 3-60
DIG_DB_Config function, 3-59, 4-10
DIG_DB_HalfReady function, 3-59, 4-12
DIG_DB_Transfer function, 3-59, 4-11
DIG_Filter_Config function, 3-60
DIG_Grp_Config function, 3-58
DIG_Grp_Mode function, 3-58
DIG_Grp_Status function, 3-58
DIG_In_Grp function, 3-58
DIG_In_Line function, 3-57
DIG_In_Prt function, 3-57
digital I/O application tips, 3-62 to 3-76
digital change detection
with 652X devices, 3-60
with 653X devices,3-61to3-62