Programming instructions

Chapter 13 Letting an Outside Source Control Your Update Rate
© National Instruments Corporation 13-3 LabVIEW Data Acquisition Basics Manual
Supplying an External Test Clock from Your DAQ Device
Suppose you want to use this external update clock approach, but you do
not have your external clock available. You can create an external test clock
using outputs from a counter/timer on your DAQ device, and then wire the
output to your external update clock source.
If your DAQ device has an FOUT or FREQ_OUT pin, you can generate
a 50% duty cycle TTL pulse train using the Generate Pulse Train
on FOUT or FREQ_OUT VI, located in
labview\examples\daq\
counter\DAQ-STC.llb
. The advantage of this VI is that it does not use
one of the available counters, which you might need for other reasons.
You can also use the Pulse Train VIs to create an external test clock.
These VIs are located in
examples\daq\counter\DAQ-STC.llb
,
examples\daq\counter\Am9513.llb
, and
examples\daq\counter\8253.llb
.