Programming instructions

Index
LabVIEW Data Acquisition Basics Manual I-14
© National Instruments Corporation
I
IBF (Input Buffer Full) line, 17-2
ICTR Control-Int VI
counting events, 27-6
counting time, 27-11
immediate digital I/O.
See
nonlatched
digital I/O.
immediate updates
multiple, 11-3
single, 11-1 to 11-2
Index Array function, 3-15
initialization of data acquisition boards, A-3
Input Buffer Full (IBF) line, 17-2
input range, and input setting selection,
5-7 to 5-8
installation and configuration
channel configuration in NI-DAQ 5.
x
or
6.0, 2-13 to 2-14
DAQ devices
installing and configuring
(figure), 2-2
using NI-DAQ 4.8.
x
on Macintosh,
2-6 to 2-8
using NI-DAQ 5.
x
or 6.0, 2-6
debugging software configuration
errors, 29-2
LabVIEW data acquisition
hardware support
Macintosh systems (table), 2-5
Windows environment (table),
2-4 to 2-5
relationship between LabVIEW, NI-DAQ,
and DAQ hardware (figure), 2-3
SCXI chassis
hardware configuration, 2-9 to 2-10
software configuration
NI-DAQ 4.8.
x
on Macintosh
systems, 2-10 to 2-13
NI-DAQ 5.
x
or 6.0, 2-10
Intermediate VIs.
See also
VIs.
advantages, 6-4 to 6-5
asynchronous continuous acquisition
using DAQ occurrences, 7-11 to 7-12
circular-buffered output, 12-5
continuous acquisition from multiple
channels, 7-10 to 7-11
continuous pulse train generation,
24-10 to 24-11
controlling pulse width measurement,
25-6 to 25-7
counting elapsed time
8253/54, 27-11
Am9513, 27-10
DAQ-STC, 27-8
counting events
8253/54, 27-6 to 27-7
Am9513, 27-5 to 27-6
DAQ-STC, 27-4
dividing frequencies, 28-2 to 28-3
finite pulse train generation, 24-15
measuring frequency and period
high frequency signals, 26-6
low frequency signals, 26-10
multiple-channel single-point analog
input, 6-3 to 6-4
multiple-waveform acquisition, 7-4 to 7-5
non-buffered handshaking, 17-5 to 17-6
overview, 3-5
SCXI temperature measurement
examples, 21-6, 21-8
simple-buffered handshaking, 17-7
simultaneous buffered waveform
acquisition and generation,
14-2 to 14-3
single-immediate updates, 11-2
single square pulse generation, 24-5
stopping counter generations, 24-23
strain gauge application, 21-14
waveform generation, 12-3
interval scanning, 5-17
isolation of transducer signals, 18-4