Programming instructions
Index
©
National Instruments Corporation I-17 LabVIEW Data Acquisition Basics Manual
ports
digital ports and lines, 15-1
grouping ports without handshaking, A-2
VI port addressing, 3-9 to 3-12
writing to digital port while reading
digital data, A-2
pressure measurement with strain gauges
(example), 21-13 to 21-16
Probe tool, 29-4
pulse generation, square.
See
square
pulse generation.
Pulse Generator Config VI, 26-6
pulse train generation, 24-9 to 24-20
8253/54, 24-3 to 24-4
continuous pulse train, 24-9 to 24-13
8253/54, 24-12 to 24-13
DAQ-STC and Am9513,
24-10 to 24-11
DAQ-STC and Am9513, 24-2 to 24-3
duty cycles (figure), 24-2
finite pulse train, 24-13 to 24-20
8253/54, 24-17 to 24-20
DAQ-STC, 24-16 to 24-17
DAQ-STC and Am9513,
24-14 to 24-15
physical connections (figure), 24-14
pulse width measurement, 25-1 to 25-9
buffered pulse and period measurement,
25-7 to 25-8
controlling pulse width measurement,
25-6 to 25-7
counting input signals (figure), 25-1
determining pulse width, 25-2 to 25-6
increasing measurable width range,
25-8 to 25-9
measuring pulse width, 25-1 to 25-2
overview, 25-1
physical connections for determining
pulse width (figure), 25-2
Pulse Width or Period Meas Config VI
controlling pulse width measurement,
25-6 to 25-7
measuring low frequency signals, 26-10
pulsed counter signal generation, 24-1
Q
questions
about using DAQ devices, 4-3 to 4-5
LabVIEW data acquisition common
questions, A-1 to A-4
R
range and polarity of device, setting, 3-14
range of device voltage
considerations for selecting analog input
settings, 5-7 to 5-8
description, 5-5
effect on ADC precision (figure), 5-5
measurement precision for various device
ranges and limit settings (table), 5-8
Read from Digital Line VI, 16-2
Read from Digital Port VI
digital input application, 21-17 to 21-18
immediate digital I/O, 16-2
referenced signal sources, 5-2
referenced single-ended (RSE) measurement
system, 5-11
18-channel RSE system (figure), 5-11
relay SCXI modules, 19-5
Remote SCXI, sampling rate limits
(note), 19-3
REQ (Request) line, 17-2
Resistance-Temperature Detectors (RTDs),
21-10 to 21-13
resolution of ADC, 5-4
effects on ADC precision (figure), 5-4
round-robin scanning (figure), 9-2
row major order, 3-14 to 3-15