FAQ
Dev found @ 0x4d,/dev/i2c-0,-,-,0x4d,0x00,1
Dev found @ 0x50,/dev/i2c-0,-,-,0x50,0x00,1
Dev found @ 0x53,/dev/i2c-0,-,-,0x53,0x00,1
Dev found @ 0x69,/dev/i2c-0,-,-,0x69,0x00,1
I2C devices found on bus #1: 0
I2C devices found on bus #2: 2
Dev found @ 0x51,/dev/i2c-2,-,-,0x51,0x00,1
Dev found @ 0x59,/dev/i2c-2,-,-,0x59,0x00,1
memtool
The memory tool (memtool) tests system memory.
EDA Quick Test mode only completes simple access (read) tests. You can use memtool to test static memory areas, such as L2Cache
mapped as SRAM or DRAM on a memory mapped device.
The memory conguration le consists of lines that describe a region of memory and the tests performed on that memory region.
Therefore, you can have multiple entries for a region of memory. All parameters are separated by a : character. The following describes the
conguration le parameters.
Parameter Description
Region Name: The region name referred to in all output.
Start Address: The starting address for the region of memory in hexadecimal format (without the preceding 0x). If the operating
software is dening how to manage memory, this is dynamic and you can use “-” for the start address and the
memory uses malloc’d from the available system memory.
Size: The size of the contiguous memory area (in bytes) in hexadecimal (without the preceding 0x). If memory is
dynamic, use “-” for size and the tests use the maximum system memory.
Access: The letter that describes how this memory is accessed:
b — byte (8 bits)
h — halfword (16 bits)
w — word (32 bits)
d — double-word (64 bits)
Increment: How many bytes to increment to the next cell.
ECC: Describes if ECC is supported — 0 or 1.
Chunk: Describes how many kilo bytes (1024 bytes) are tested in one chunk. Tests multiple chunks across the memory
region.
Max Cache: The maximum cache size for this memory.
Cacheline: The size of a cacheline.
Iterations: The number of times to perform the tests.
Test: The collection of bits that tell which test to perform on this region. The tests are performed in bit order. Some tests
may not be performed due to time limitations and the purpose of the test (for example, dim cache memory test
which is time consuming and destructive to data). To run an excluded test, you must specically request the test.
For example, to run all tests including the dim cache memory test, which is a 0x800, set the tests to fff.
A-1 — run all available tests.
16 ONIE diagnostics