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Zynq-7000 AP SoC Technical Reference Manual www.xilinx.com 660
UG585 (v1.11) September 27, 2016
Chapter 23
Programmable Logic Test and Debug
23.1 Introduction
Zynq-7000 AP SoC devices provides extensive debug capability for accessing the PS debug structure
(see Chapter 28, System Test and Debug) from the PL. This allows for integrated test and debug on
both PS and PL simultaneously.
Xilinx provides the fabric trace monitor (FTM) for programmable logic test and debug. It is based on
the ARM CoreSight architecture, and is a component of the trace source class (see Chapter 28,
System Test and Debug) in the CoreSight system within Zynq-7000 AP SoC devices. The FTM receives
trace data from the PL and formats it into trace packets to be combined with the trace packets from
other trace source components such as PTM and ITM. With this capability, PL events can easily be
traced simultaneously with PS events. The FTM also supports cross-triggering between the PS and
PL, except for the trace dumping feature. In addition, the FTM provides general-purpose debug
signals between the PS and PL.
23.1.1 Features
The key features of the PL test and debug are as follows:
ARM CoreSight compliant
32-bit trace data from the PL
4-bit trace ID from the PL
Clock domain crossing between the PL and PS
FIFO buffering for trace packets to absorb bursts of trace data from the PL
Indication of FIFO overflow via generation of an overflow packet
Trace packets are compatible with ARM trace port software and hardware
Trigger signals to/from the PL
General-purpose I/Os to/from the PL