User manual

Table Of Contents
Zynq-7000 AP SoC Technical Reference Manual www.xilinx.com 713
UG585 (v1.11) September 27, 2016
Chapter 27: JTAG and DAP Subsystem
The PL Xilinx TAP controller serves four key purposes: boundary scan test, eFuse programming,
BBRAM programming, and PL debug chipscope.
The TPIU provides the mechanism to capture trace over long periods of time. There is no internal
time limit to how long a trace can be dumped so the only practical limit is the Zynq-7000 bandwidth.
If doing a trace dump using PS I/O through MIO, the maximum trace bandwidth depends on how
many MIO trace I/Os could be allocated. Another alternative is trace dump through EMIO. PL soft
logic connects the EMIO trace signal to the PL SelectIO. There are other potential innovative ways to
handle EMIO trace.
For example, users could loopback EMIO trace data back to the PS and store it in DDR memory or
export trace via gigabit Ethernet to enable remote debug or monitor. In typical debug flow, the user
enables minimum trace source dumping capability to fit trace data into allocated TPIU throughput.
After a small time window when debug occurs as determined through trace monitoring, the user
could enable full trace dumping capability if required, and store short periods of data into the ETB
for the next level of debug. Other than debugging, trace port also brings significant value for
software profiling. Soft profiling helps the user to identify those software routines that consume the
X-Ref Target - Figure 27-3
Figure 27-3: Debug System Architecture
PL Logic
CTM
ITM
Funnel
(CSTF)
TPIU
4K
ETB
Trace Port
Top Switch
AHB-
AXI
Debug JTAG Interface
(Chipscope)
PL
XILINX TAP
JTAG-DP
ARM DAP
PS_Pad
PL_Pad
TDO
TDI TDO
TDI
Xilinx Custom Design
Debug APB
FTM
Trace
TDI
TDO
PS
Trace ATB
AHB-AP
CTI
CPU
PTM
CPU
PTM
CTI
APB-AP
CTI
CTI
CTM
Time Stamp
Time Stamp
Cross Triggering
Trace Bus(ATB)
Debug APB
CPU Debug
ROM
eFuse BBRAM
UG585_c27_03_021313
Cross Trig(8)