Technical data

Table 2–8 (Cont.) Memory Self-Test (5)
Self-Test Function
Memory test
(forward)
Performs a read/compare/complement/write on the memory in the
forward direction.
If a page is found to be bad, the appropriate bit in the memory
bitmap is cleared.
Memory test
(reverse)
Starts at the last address to be tested and performs a
read/compare/complement/write on memory.
If a page is found to be bad, the appropriate bit in the memory
bitmap is cleared.
Final parity test Fills all of memory with a pattern of 01h (an odd bit pattern) to
verify that the parity bit can be changed.
This pattern is read and verified. A parity error occurs if the parity
bit is not changed.
The pattern 01010101h is the known state of unused memory after
power-up.
Refer to Section A.2.3 for a list of the memory test error codes and to
Section B.9 for a list of the memory test diagnostic LED codes.
2.8.6 Floating-Point Unit Self-Test (T 6)
Table 2–9 lists the tests that are included in the floating-point unit self-test.
Table 2–9 Floating-Point Unit Self-Test (6)
Self-Test Function
Instruction tests Tests are performed on the floating-point unit (FPU).
Failure occurs if the instruction produces unexpected results or if an
unexpected exception occurs during the execution of the instruction.
Refer to Section A.2.18 for a list of the FPU test error codes.
2.8.7 Interval Timer Self-Test (T 7)
Table 2–10 lists the tests that are included in the interval timer self-test.
Diagnostic Testing 2–17