Datasheet

BZX85C...
TELEFUNKEN Semiconductors
Rev. A2, 24-Jun-96
1 (5)
Silicon Epitaxial Planar Z–Diodes
Features
Sharp edge in reverse characteristics
Low reverse current
Low noise
Very high stability
Available with tighter tolerances
Applications
Voltage stabilization
94 9369
Absolute Maximum Ratings
T
j
= 25 C
Parameter Test Conditions Type Symbol Value Unit
Power dissipation l=4mm, T
L
=25 C P
V
1.3 W
Junction temperature T
j
175 C
Storage temperature range T
stg
–65...+175 C
Maximum Thermal Resistance
T
j
= 25 C
Parameter Test Conditions Symbol Value Unit
Junction ambient l=4mm, T
L
=constant R
thJA
110 K/W
Characteristics
T
j
= 25 C
Parameter Test Conditions Type Symbol Min Typ Max Unit
Forward voltage I
F
=200mA V
F
1 V

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