Datasheet

Everlight Electronics Co., Ltd. http:\\www.everlight.com Rev
： 1 Page ： 6 of 7
Device No ： CDRX-810-010 Prepared date ： 2006/12/29 Prepared by ： Kunjiang Xie
ITR8010
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█ Reliability Test Item And Condition
The reliability of products shall be satisfied with items listed below.
Confidence level：90%
LTPD：10%
NO.
Item Test Condition
Test
Hours/
Cycle
Sample
Size
Failure
Judgement
Criteria
Ac/R
e
1
Solder
Heat
TEMP : 260℃ ± 5 ℃ 10 sec 22 PCs 0/1
2
Temperature
Cycle
H : +100 ℃ 15 min
5 min
L : -40 ℃ 15 min
300
cycle
22 PCs
Ee≦L×0.8
V
F
≦U
0/1
3 Thermal Shock
H : +100 ℃ 5 min
10 sec
L : -10 ℃ 5 min
300
cycle
22 PCs
U :Upper
specification
limit
L :the initial
test value
0/1
4 High
Temperature
Storage
TEMP. : +100 ℃
1000
hrs
22 PCs 0/1
5 Low
Temperature
Storage
TEMP. : -40 ℃
1000
hrs
22 PCs 0/1
6 DC Operating
Life
V
CE
=5V
I
F
=20mA
1000
hrs
22 PCs 0/1
7 High
Temperature /
High Humidity
85 ℃ / 85% R.H.
1000
hrs
22 PCs 0/1