Datasheet

Everlight Electronics Co., Ltd. http:\\www.everlight.com Rev :4 Page: 6of 7
Device No：CDRX-200-006 Prepared date：2005/10/18 Prepared by：zhouhong
ITR20001/T
█ Reliability Test Item And Condition
The reliability of products shall be satisfied with items listed below.
Confidence level：90%
LTPD：10%
NO.
Item Test Condition
Test
Hours/
Cycle
Sample
Size
Failure
Judgement
Criteria
Ac/Re
1 Solder Heat
TEMP : 260℃ ± 5 ℃
10 sec 22 PCs 0/1
2 Temperature Cycle
H : +100℃ 15 mins
5 min
L : -40℃ 15 min
300
cycle
22 PCs
Ic(on)≦L×0.8
0/1
3 Thermal Shock
H : +100℃ 5 min
10 sec
L : -10℃ 5 min
300
cycle
22 PCs
L :Lower
specification
limit
0/1
4 High Temperature
Storage
TEMP. : +100℃
1000
hrs
22 PCs 0/1
5 Low Temperature
Storage
TEMP. : -40℃
1000
hrs
22 PCs 0/1
6
DC Operating Life
V
CE
=5V
I
F
=20mA
1000
hrs
22 PCs 0/1
7 High Temperature /
High Humidity
85℃ / 85% R.H.
1000
hrs
22 PCs 0/1