Datasheet

ManualsBrandsFAIRCHILD SEMICONDUCTOR ManualsFETsFDA38N30, MOSFET

November 2013

FDA38N30 — N-Channel UniFET

MOSFET

FDA38N30 Rev. C1

www.fairchildsemi.com

FDA38N30

N-Channel UniFET

MOSFET

300 V, 38 A, 85 mΩ

Features

•R

DS(on)

= 70 mΩ (Typ.) @ V

= 10 V, I

= 19 A

• Low Gate Charge (Typ. 60 nC)

• Low C

rss

(Typ. 60 pF)

• 100% Avalanche Tested

• ESD Improved Capability

• RoHS Compliant

Applications

•PDP TV

• Uninterruptible Power Supply

• AC-DC Power Supply

Description

UniFET

MOSFET is Fairchild Semiconductor’s high voltage

MOSFET family based on planar stripe and DMOS technology.

This MOSFET is tailored to reduce on-state resistance, and to

provide better switching performance and higher avalanche

energy strength. This device family is suitable for switching

power converter applications such as power factor correction

(PFC), flat panel display (FPD) TV power, ATX and electronic

lamp ballasts.

TO-3PN

MOSFET Maximum Ratings T

= 25

C unless otherwise noted.

Thermal Characteristics

Symbol Parameter FDA38N30 Unit

DSS

Drain to Source Voltage 300 V

GSS

Gate to Source Voltage ±30 V

Drain Current

- Continuous (T

= 25

C) 38

- Continuous (T

= 100

C) 22

Drain Current - Pulsed (Note 1) 150 A

Single Pulsed Avalanche Energy (Note 2) 1200 mJ

Avalanche Current (Note 1) 38 A

Repetitive Avalanche Energy (Note 1) 31 mJ

dv/dt Peak Diode Recovery dv/dt (Note 3) 4.5 V/ns

Power Dissipation

= 25

C) 312 W

- Derate Above 25

C2.5W/

, T

STG

Operating and Storage Temperature Range -55 to +150

Maximum Lead Temperature for Soldering, 1/8” from Case for 5 Seconds

300

Symbol Parameter FDA38N30 Unit

θJC

Thermal Resistance, Junction to Case, Max. 0.4

C/W

θJA

Thermal Resistance, Junction to Ambient, Max. 40

Summary of content (8 pages)

PAGE 1
FDA38N30 N-Channel UniFETTM MOSFET 300 V, 38 A, 85 mΩ Features Description • RDS(on) = 70 mΩ (Typ.) @ VGS = 10 V, ID = 19 A UniFETTM MOSFET is Fairchild Semiconductor’s high voltage MOSFET family based on planar stripe and DMOS technology. This MOSFET is tailored to reduce on-state resistance, and to provide better switching performance and higher avalanche energy strength.
PAGE 2
Part Number Top Mark FDA38N30 FDA38N30 Electrical Characteristics Symbol Package TO-3PN Packing Method Tube Reel Size N/A Tape Width N/A Quantity 30 units TC = 25°C unless otherwise noted. Parameter Conditions Min. Typ. Max Unit 300 - - V V/°C Off Characteristics BVDSS Drain to Source Breakdown Voltage ID = 250 μA, VGS = 0 V, TC = 25oC ΔBVDSS / ΔTJ Breakdown Voltage Temperature Coefficient ID = 250 μA, Referenced to 25°C - 0.
PAGE 3
Figure 1. On-Region Characteristics Figure 2. Transfer Characteristics VGS Top : 15.0 V 10.0 V 8.0 V 7.0 V 6.5 V 6.0 V Bottom : 5.5 V ID, Drain Current [A] 2 10 ID, Drain Current [A] 2 10 1 10 o 150 C 1 10 o 25 C o -55 C * Notes: 1. VDS = 20V * Notes: 1. 250μs Pulse Test 0 10 o 2. 250μs Pulse Test 2. TC = 25 C 0 -1 0 10 10 1 10 10 2 4 6 8 10 12 VGS, Gate-Source Voltage [V] VDS, Drain-Source Voltage [V] Figure 3. On-Resistance Variation vs.
PAGE 4
Figure 7. Breakdown Voltage Variation vs. Temperature Figure 8. On-Resistance Variation vs. Temperature 3.0 RDS(on), [Normalized] Drain-Source On-Resistance BVDSS, [Normalized] Drain-Source Breakdown Voltage 1.2 1.1 1.0 0.9 *Notes: 1. VGS = 0V 2. ID = 250uA 0.8 -100 -50 0 50 100 o TJ, Junction Temperature [ C] 2.5 2.0 1.5 1.0 0.0 -100 150 Figure 9. Maximum Safe Operating Area *Notes: 1. VGS = 10V 2. ID = 19A 0.5 -50 0 50 100 o TJ, Junction Temperature [ C] 150 Figure 10.
PAGE 5
0KΩ 200nF 12V FDA38N30 — N-Channel UniFETTM MOSFET VGS Same Type as DUT Qg 10V 300nF VDS VGS Qgs Qgd DUT IG = const. 3mA Charge Figure 12. Gate Charge Test Circuit & Waveform VDS RG RL VDS 90% VDD VGS VGS DUT V 10V GS 10% td(on) tr td(off) t on tf t off Figure 13. Resistive Switching Test Circuit & Waveforms BVDSS 1 EAS = ---- L IAS2 -------------------2 BVDSS - VDD L VDS BVDSS IAS ID RG V 10V GS GS VDD ID (t) VDS (t) VDD DUT tp tp Time Figure 14.
PAGE 6
FDA38N30 — N-Channel UniFETTM MOSFET DUT + VDS _ I SD L Driver RG VGS VGS ( Driver ) Same Type as DUT VDD • dv/dt controlled by RG • ISD controlled by pulse period Gate Pulse Width D = -------------------------Gate Pulse Period 10V IFM , Body Diode Forward Current I SD ( DUT ) di/dt IRM Body Diode Reverse Current VDS ( DUT ) Body Diode Recovery dv/dt VSD VDD Body Diode Forward Voltage Drop Figure 15.
PAGE 7
FDA38N30 — N-Channel UniFETTM MOSFET Mechanical Dimensions Figure 16. TO3, 3-Lead, Plastic, EIAJ SC-65 Package drawings are provided as a service to customers considering Fairchild components. Drawings may change in any manner without notice. Please note the revision and/or date on the drawing and contact a Fairchild Semiconductor representative to verify or obtain the most recent revision.
PAGE 8
tm *Trademarks of System General Corporation, used under license by Fairchild Semiconductor. DISCLAIMER FAIRCHILD SEMICONDUCTOR RESERVES THE RIGHT TO MAKE CHANGES WITHOUT FURTHER NOTICE TO ANY PRODUCTS HEREIN TO IMPROVE RELIABILITY, FUNCTION, OR DESIGN. FAIRCHILD DOES NOT ASSUME ANY LIABILITY ARISING OUT OF THE APPLICATION OR USE OF ANY PRODUCT OR CIRCUIT DESCRIBED HEREIN; NEITHER DOES IT CONVEY ANY LICENSE UNDER ITS PATENT RIGHTS, NOR THE RIGHTS OF OTHERS.