FDP42AN15A0 N-Channel PowerTrench® MOSFET 150 V, 35 A, 42 mΩ Features Applications • RDS(on) = 36 mΩ ( Typ.) @ VGS = 10 V, ID = 12 A • Consumer Appliances • QG(tot) = 33 nC ( Typ.
Device Marking Device Package Reel Size Tape Width Quantity FDP42AN15A0 FDP42AN15A0 TO-220 Tube N/A 50 units Electrical Characteristics TC = 25°C unless otherwise noted Symbol Parameter Test Conditions Min Typ Max Unit 150 - - - V - 1 - - 250 µA VGS = ±20V - - ±100 nA V Off Characteristics B VDSS Drain to Source Breakdown Voltage IDSS Zero Gate Voltage Drain Current IGSS Gate to Source Leakage Current ID = 250µA, VGS = 0V V DS = 120V VGS = 0V TC = 150oC On Characte
1.2 40 ID, DRAIN CURRENT (A) POWER DISSIPATION MULTIPLIER 1.0 0.8 0.6 0.4 0.2 0 0 25 50 75 100 150 125 30 20 10 0 175 25 50 75 TC , CASE TEMPERATURE (o C) Figure 1. Normalized Power Dissipation vs Ambient Temperature 2 125 150 175 Figure 2. Maximum Continuous Drain Current vs Case Temperature DUTY CYCLE - DESCENDING ORDER 0.5 0.2 0.1 0.05 0.02 0.01 1 ZθJC, NORMALIZED THERMAL IMPEDANCE 100 TC, CASE TEMPERATURE (oC) PDM 0.
100 200 If R = 0 tAV = (L)(IAS)/(1.3*RATED BVDSS - VDD) If R ≠ 0 tAV = (L/R)ln[(IAS*R)/(1.3*RATED BVDSS - VDD) +1] 10µs 10 IAS, AVALANCHE CURRENT (A) ID, DRAIN CURRENT (A) 100 100µs OPERATION IN THIS AREA MAY BE LIMITED BY rDS(ON) 1ms 1 SINGLE PULSE TJ = MAX RATED TC = 25oC 0.1 1 DC 10 100 10ms STARTING TJ = 25oC 10 STARTING TJ = 150 oC 1 0.001 300 0.01 0.1 1 tAV, TIME IN AVALANCHE (ms) VDS, DRAIN TO SOURCE VOLTAGE (V) Figure 5.
1.2 1.2 NORMALIZED DRAIN TO SOURCE BREAKDOWN VOLTAGE NORMALIZED GATE THRESHOLD VOLTAGE VGS = VDS, I D = 250µA 1.0 0.8 0.6 0.4 -80 -40 0 40 80 120 TJ, JUNCTION TEMPERATURE 160 VGS , GATE TO SOURCE VOLTAGE (V) C, CAPACITANCE (pF) 10 CISS = CGS + CGD COSS ≅ C DS + C GD CRSS = CGD 100 VGS = 0V, f = 1MHz 0.1 1.
VDS BVDSS tP L VARY tP TO OBTAIN REQUIRED PEAK IAS + RG - VGS VDS IAS VDD VDD DUT tP 0V IAS 0 0.01Ω tAV Figure 15. Unclamped Energy Test Circuit Figure 16. Unclamped Energy Waveforms VDS VDD Qg(TOT) VDS L VGS + - VGS VGS = 10V Qgs2 VDD DUT VGS = 2V Ig(REF) 0 Qg(TH) Qgs Qgd Ig(REF) 0 Figure 17. Gate Charge Test Circuit Figure 18. Gate Charge Waveforms VDS tON tOFF td(ON) td(OFF) RL tr VDS 90% - VDD 10% 0 10% DUT 90% VGS VGS 0 Figure 19.
.SUBCKT FDB42AN15A0 2 1 3 ; rev June 11, 2002 Ca 12 8 6.0e-10 Cb 15 14 8e-10 Cin 6 8 2.1e-9 DPLCAP 10 RSLC2 + GATE 1 Lgate 1 9 4.81e-9 Ldrain 2 5 1.0e-9 Lsource 3 7 4.63e-9 RLGATE EVTEMP RGATE + 18 22 9 20 ESLC 11 50 EVTHRES + 19 8 6 21 EBREAK 16 + 17 18 - DBODY MWEAK MMED MSTRO CIN LSOURCE 8 7 RSOURCE RLgate 1 9 48.1 RLdrain 2 5 10 RLsource 3 7 46.3 Mmed 16 6 8 8 MmedMOD Mstro 16 6 8 8 MstroMOD Mweak 16 21 8 8 MweakMOD DBREAK RDRAIN 6 8 ESG LGATE 5 51 - Ebreak 11 7 17 18 159.
rev June 11, 2002 template FDB42AN15A0 n2,n1,n3 electrical n2,n1,n3 { var i iscl dp..model dbodymod = (isl=2.4e-11,nl=1.08,rs=4.2e-3,trs1=2.2e-3,trs2=2.5e-9,cjo=1.35e-9,m=6.3e-1,tt=4.8e-8,xti=3.9) dp..model dbreakmod = (rs=1.5e-1,trs1=1e-3,trs2=-8.9e-6) dp..model dplcapmod = (cjo=.43e-9,isl=10e-30,nl=10,m=0.66) m..model mmedmod = (type=_n,vto=3.5,kp=4,is=1e-30, tox=1) m..model mstrongmod = (type=_n,vto=4.0,kp=70,is=1e-30, tox=1) m..model mweakmod = (type=_n,vto=3.12,kp=0.06,is=1e-30, tox=1,rs=.
th JUNCTION REV 23 June 11, 2002 FDB42AN15A0_Thermal CTHERM1 TH 6 2e-3 CTHERM2 6 5 4.5e-3 CTHERM3 5 4 7e-3 CTHERM4 4 3 3e-2 CTHERM5 3 2 4e-2 CTHERM6 2 TL 8.5e-1 RTHERM1 CTHERM1 6 RTHERM1 TH 6 6.2e-2 RTHERM2 6 5 8.2e-2 RTHERM3 5 4 9.2e-2 RTHERM4 4 3 9.7e-2 RTHERM5 3 2 0.2 RTHERM6 2 TL 0.22 RTHERM2 CTHERM2 5 SABER Thermal Model RTHERM3 SABER thermal model FDB42AN15A0_Thermal template thermal_model th tl thermal_c th, tl { ctherm.ctherm1 th 6 =2e-3 ctherm.ctherm2 6 5 =4.5e-3 ctherm.
FDP42AN15A0 — N-Channel PowerTrench® MOSFET Mechanical Dimensions TO-220 3L Figure 21. TO-220, Molded, 3Lead, Jedec Variation AB Package drawings are provided as a service to customers considering Fairchild components. Drawings may change in any manner without notice. Please note the revision and/or date on the drawing and contact a Fairchild Semiconductor representative to verify or obtain the most recent revision.
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