Datasheet

©2008 Fairchild Semiconductor Corporation www.fairchildsemi.com
FOD060L, FOD260L Rev. 1.0.5 4
FOD060L, FOD260L — 3.3V/5V High Speed-10 MBit/s Logic Gate Optocouplers
Transfer Characteristics (T
A
= -40°C to +85°C Unless otherwise specified. Typical value is measured at
T
A
= 25°C and V
CC
= 3.3V)
Isolation Characteristics (T
A
= -40°C to +85°C Unless otherwise specified. Typical value is measured at
T
A
= 25°C and V
CC
= 3.3V)
Notes
1. The V
CC
supply to each optoisolator must be bypassed by a 0.1µF capacitor or larger. This can be either a ceramic
or solid tantalum capacitor with good high frequency characteristic and should be connected as close as possible
to the package V
CC
and GND pins of each device.
2. Enable Input – No pull up resistor required as the device has an internal pull up resistor.
3. t
PLH
– Propagation delay is measured from the 3.75 mA level on the HIGH to LOW transition of the input current
pulse to the 1.5V level on the LOW to HIGH transition of the output voltage pulse.
4. t
PHL
– Propagation delay is measured from the 3.75 mA level on the LOW to HIGH transition of the input current
pulse to the 1.5V level on the HIGH to LOW transition of the output voltage pulse.
5. t
PSK
is the worst case difference between t
PHL
and t
PLH
for any devices at the stated test conditions.
6. t
r
– Rise time is measured from the 90% to the 10% levels on the LOW to HIGH transition of the output pulse.
7. t
f
– Fall time is measured from the 10% to the 90% levels on the HIGH to LOW transition of the output pulse.
8. t
ELH
– Enable input propagation delay is measured from the 1.5V level on the HIGH to LOW transition of the input
voltage pulse to the 1.5V level on the LOW to HIGH transition of the output voltage pulse.
9. t
EHL
– Enable input propagation delay is measured from the 1.5V level on the LOW to HIGH transition of the input
voltage pulse to the 1.5V level on the HIGH to LOW transition of the output voltage pulse.
10. CM
H
– The maximum tolerable rate of rise of the common mode voltage to ensure the output will remain in the high
state (i.e., V
OUT
> 2.0 V). Measured in volts per microsecond (V/µs).
11. CM
L
– The maximum tolerable rate of fall of the common mode voltage to ensure the output will remain in the low
output state (i.e., V
OUT
< 0.8 V). Measured in volts per microsecond (V/µs).
12. Device considered a two-terminal device: Pins 1, 2, 3 and 4 shorted together, and Pins 5, 6, 7 and 8 shorted
together.
Symbol DC Characteristics Test Conditions Min. Typ. Max. Unit
I
OH
High Level Output Current I
F
= 250 µA, V
CC
= 3.3 V, V
O
= 3.3 V,
V
E
= 2.0 V (Note 2)
0.01 50 µA
V
OL
Low Level Output Voltage V
CC
= 3.3 V, I
F
= 5 mA, I
OL
= 13 mA,
V
E
= 2.0 V (Note 2)
0.3 0.6 V
I
FT
Input Threshold Current V
CC
= 3.3 V, V
O
= 0.6 V, I
OL
= 13 mA,
V
E
= 2.0 V (Note 2)
15mA
Symbol Characteristics Test Conditions Min. Typ. Max. Unit
I
I-O
Input-Output
Insulation Leakage Current
Relative humidity = 45%,
T
A
= 25°C, t = 5 s,
V
I-O
= 3000 VDC (Note 12)
1.0 µA
V
ISO
Withstand Insulation Test
Voltage
FOD060L
FOD260L
I
IO
≤ 2 µA, R
H
< 50%,
T
A
= 25°C, t = 1 min.(Note 12)
3750
V
RMS
5000
R
I-O
Resistance (Input to Output) V
I-O
= 500 V (Note 12) 10
12
Ω
C
I-O
Capacitance (Input to Output) f = 1 MHz (Note 12) 0.6 pF