Datasheet

©2008 Fairchild Semiconductor Corporation www.fairchildsemi.com
FOD3150 Rev. 1.0.4 14
FOD3150 — High Noise Immunity, 1.0A Output Current, Gate Drive Optocoupler
Test Circuit (Continued)
Figure 29. t
PHL
, t
PLH
, t
R
and t
F
Test Circuit and Waveforms
Figure 30. CMR Test Circuit and Waveforms
V
O
Probe
F = 10kHz
DC = 50%
I
F
V
OUT
t
PLH
Cg = 10nF
Rg = 20Ω
50Ω
1
2
3
4
8
7
6
5
0.1µF
V
CC
= 15 to 30V
+
–+
–
t
r
t
f
90%
50%
10%
t
PHL
1
2
A
B
V
O
3
4
8
7
6
5
0.1µF
V
CC
= 30V
V
CM
= 2,000V
I
F
+
–
5V
+
–
∆t
V
CM
V
O
Switch at A: I
F
= 10mA
Switch at B: I
F
= 0mA
V
OH
V
O
V
OL
0V
+ –