Datasheet

©2008 Fairchild Semiconductor Corporation www.fairchildsemi.com
FOD3150 Rev. 1.0.4 12
FOD3150 — High Noise Immunity, 1.0A Output Current, Gate Drive Optocoupler
Test Circuit (Continued)
Figure 24. I
CCH
Test Circuit
Figure 25. I
CCL
Test Circuit
1
2
I
F
= 7 to 16mA
V
O
3
4
8
7
6
5
0.1µF
V
CC
= 30V
+
–
1
2
V
F
= 0 to 0.8V
V
O
3
4
8
7
6
5
0.1µF
V
CC
= 30V
+
–
+
–