Datasheet

©2010 Fairchild Semiconductor Corporation www.fairchildsemi.com
FOD8316 Rev. 1.2.0 17
FOD8316 — 2.5A Output Current, IGBT Drive Optocoupler with Desaturation Detection and Isolated Fault Sensing
Test Circuits (Continued)
Figure 38. Low Level Output Current During Fault Conditions (I
OLF
), Blanking Capacitor Charge Current (I
CHG
),
Blanking Capacitor Discharging Current (I
DSCHG
) and DESAT Threshold (V
DESAT
) Test Circuit
Figure 39. Under Voltage Lockout Threshold (V
UVLO
) Test Circuit
Figure 40. Propagation Delay (t
PLH
, t
PHL
), Pulse Width Distortion (PWD),
Rise Time (t
R
) and Fall Time (t
F
) Test Circuit
1
2
3
4
5
6
7
8
V
IN+
V
IN–
V
DD1
GND1
RESET
FAULT
V
LED1+
V
LED1-
*
V
E
V
LED2+
DESAT
V
DD2
V
S
V
O
V
SS
V
SS
16
15
14
13
12
11
10
9
FOD8316
V
E
V
DESAT
V
O
I
CHG/DSCHG
I
OLF
0.1μF
RL
0.1μF
10nF
0.1μF
3K
5V
30V
+
–
+
–
+
–
+
–
V
RL
*Pin 8 (V
LED1-
) is internally connected to pin 4 (GND1).
1
2
3
4
5
6
7
8
V
IN+
V
IN–
V
DD1
GND1
RESET
FAULT
V
LED1+
V
LED1-
*
V
E
V
LED2+
DESAT
V
DD2
V
S
V
O
V
SS
V
SS
16
15
14
13
12
11
10
9
FOD8316
V
O
0.1μF
0.1μF
5V
DC Sweep
0 to 15V
(100 steps)
Parameter
Analyzer
+
–
+
–
*Pin 8 (V
LED1-
) is internally connected to pin 4 (GND1).
1
2
3
4
5
6
7
8
V
IN+
V
IN–
V
DD1
GND1
RESET
FAULT
V
LED1+
V
LED1-
*
V
E
V
LED2+
DESAT
V
DD2
V
S
V
O
V
SS
V
SS
16
15
14
13
12
11
10
9
FOD8316
V
E
V
O
0.1μF
0.1μF
10nF
0.1μF
3K
RL
5V
30V
+
–
+
–
+
–
F = 10kHz
DC = 50%
+
–
V
CL
*Pin 8 (V
LED1-
) is internally connected to pin 4 (GND1).