Datasheet

©2010 Fairchild Semiconductor Corporation www.fairchildsemi.com
FODM8801X Rev. 1.1.2 9
FODM8801X — OptoHiT™ Series, High-Temperature Phototransistor Optocoupler in Half-Pitch Mini-Flat 4-Pin Package
Test Circuits
Figure 15. Test Circuit for Propagation Delay, Rise Time, and Fall Time
Figure 16. Test Circuit for Instantaneous Common-Mode Rejection Voltage
Output Pulse
V
O
Monitoring Node
t
ON
R
M
I
F
1
+
2
4
3
Pulse Generator:
tr = 5ns
Z
O
= 50Ω
PW = 50μs
DC = 1%
R
L
= 4.7kΩ
+5V
V
O
GND
I
F
Monitor
t
R
t
F
t
OFF
(I
F
= 1.6mA)
V
OL
5V
90%
10%
Input Pulse
V
O
(I
F
= 0mA)
V
O
(I
F
= 1.6mA)
Pulse Gen
V
CM
V
CM
R
M
SW
+5V
1kV
0V
V
OH
2V
0.8V
V
OL
90%
10%
V
O
Monitoring Node
I
F
1
+
2
4
3
R
L
= 4.7kΩ
GND