Datasheet

©2005 Fairchild Semiconductor Corporation www.fairchildsemi.com
MOC301XM, MOC302XM Rev. 1.0.3 3
MOC301XM, MOC302XM — 6-Pin DIP Random-Phase Optoisolators Triac Driver Output (250/400 Volt Peak)
Absolute Maximum Ratings
Stresses exceeding the absolute maximum ratings may damage the device. The device may not function or be
operable above the recommended operating conditions and stressing the parts to these levels is not recommended.
In addition, extended exposure to stresses above the recommended operating conditions may affect device reliability.
The absolute maximum ratings are stress ratings only.
T
A
= 25°C unless otherwise specified.
Note:
1. Isolation surge voltage, V
ISO
, is an internal device dielectric breakdown rating. For this test, pins 1 and 2 are common,
and pins 4, 5 and 6 are common.
Symbol Parameters Device Value Units
TOTAL DEVICE
T
STG
Storage Temperature All -40 to +150 °C
T
OPR
Operating Temperature All -40 to +85 °C
T
SOL
Lead Solder Temperature All 260 for
10 seconds
°C
T
J
Junction Temperature Range All -40 to +100 °C
V
ISO
Isolation Surge Voltage
(1)
(Peak AC Voltage, 60 Hz, 1 Second Duration)
All 7500 Vac(pk)
P
D
Total Device Power Dissipation at 25°C Ambient
Derate Above 25°C
All 330 mW
4.4 mW/°C
EMITTER
I
F
Continuous Forward Current All 60 mA
V
R
Reverse Voltage All 3 V
P
D
Total Power Dissipation at 25°C Ambient
Derate Above 25°C
All 100 mW
1.33 mW/°C
DETECTOR
V
DRM
Off-State Output Terminal Voltage MOC3010M/1M/2M
MOC3020M/1M/2M/3M
250
400
V
I
TSM
Peak Repetitive Surge Current
(PW = 100 µs, 120 pps)
All 1 A
P
D
Total Power Dissipation at 25°C Ambient
Derate Above 25°C
All 300 mW
4 mW/°C