Datasheet

©2005 Fairchild Semiconductor Corporation www.fairchildsemi.com
MOC303XM, MOC304XM Rev. 1.0.7 2
MOC303XM, MOC304XM — 6-Pin DIP Zero-Cross Optoisolators Triac Driver Output (250/400 Volt Peak)
Absolute Maximum Ratings
(T
A
= 25°C unless otherwise noted)
Stresses exceeding the absolute maximum ratings may damage the device. The device may not function or be
operable above the recommended operating conditions and stressing the parts to these levels is not recommended.
In addition, extended exposure to stresses above the recommended operating conditions may affect device reliability.
The absolute maximum ratings are stress ratings only.
Note
1. Isolation surge voltage, V
ISO
, is an internal device dielectric breakdown rating. For this test, Pins 1 and 2 are
common, and Pins 4, 5 and 6 are common.
Symbol Parameters Device Value Units
TOTAL DEVICE
T
STG
Storage Temperature All -40 to +150 °C
T
OPR
Operating Temperature All -40 to +85 °C
T
SOL
Lead Solder Temperature All 260 for 10
sec
°C
T
J
Junction Temperature Range All -40 to +100 °C
V
ISO
Isolation Surge Voltage
(1)
(peak AC voltage, 60Hz, 1 sec. duration, I
I-O
≤ 2µA)
All 7500 Vac(pk)
P
D
Total Device Power Dissipation @ 25°C
Derate above 25°C
All 250 mW
2.94 mW/°C
EMITTER
I
F
Continuous Forward Current All 60 mA
V
R
Reverse Voltage All 6 V
P
D
Total Power Dissipation 25°C Ambient
Derate above 25°C
All 120 mW
1.41 mW/°C
DETECTOR
V
DRM
Off-State Output Terminal Voltage MOC3031M/2M/3M 250 V
MOC3041M/2M/3M 400
I
TSM
Peak Repetitive Surge Current
(PW = 100µs, 120 pps)
All 1 A
P
D
Total Power Dissipation @ 25°C Ambient
Derate above 25°C
All 150 mW
All 1.76 mW/°C