Datasheet

©2005 Fairchild Semiconductor Corporation www.fairchildsemi.com
MOC3081M, MOC3082M, MOC3083M Rev. 1.0.3 2
MOC3081M, MOC3082M, MOC3083M — 6-Pin Zero-Cross Optoisolators Triac Driver Output (800 Volt Peak)
Absolute Maximum Ratings
(T
A
= 25°C unless otherwise noted)
Stresses exceeding the absolute maximum ratings may damage the device. The device may not function or be
operable above the recommended operating conditions and stressing the parts to these levels is not recommended.
In addition, extended exposure to stresses above the recommended operating conditions may affect device reliability.
The absolute maximum ratings are stress ratings only.
Note:
1. Isolation surge voltage, V
ISO
, is an internal device dielectric breakdown rating. For this test, Pins 1 and 2 are
common, and Pins 4, 5 and 6 are common.
Symbol Parameters Value Units
TOTAL DEVICE
T
STG
Storage Temperature -40 to +150 °C
T
OPR
Operating Temperature -40 to +85 °C
T
SOL
Lead Solder Temperature 260 for 10 sec °C
T
J
Junction Temperature Range -40 to +100 °C
V
ISO
Isolation Surge Voltage
(1)
(peak AC voltage, 60Hz, 1 sec. duration) 7500 Vac(pk)
P
D
Total Device Power Dissipation @ 25°C Ambient
Derate above 25°C
250 mW
2.94 mW/°C
EMITTER
I
F
Continuous Forward Current 60 mA
V
R
Reverse Voltage 6 V
P
D
Total Power Dissipation @ 25°C Ambient
Derate above 25°C
120 mW
1.41 mW/°C
DETECTOR
V
DRM
Off-State Output Terminal Voltage 800 V
I
TSM
Peak Repetitive Surge Current (PW = 100µs, 120pps) 1 A
P
D
Total Power Dissipation @ 25°C Ambient
Derate above 25°C
150 mW
1.76 mW/°C