User's Manual
Testing
Introduction
5
5-3
Introduction
This chapter discusses the following topics:
• Test Scheduling
• The Calibrator Manager
• Setup vs. Test Procedure
• Testing with Calibrators
• As-Found and As-Left Tests
• Switch testing vs. Instrument Testing
• Manual Testing
• Tag ID vs. SN History
• Troubleshooting
Test Scheduling
Scheduled Testing
With respect to device testing, scheduled maintenance falls into two general
categories: preventative and predictive. Preventative maintenance may be thought
of as regularly scheduled testing, perhaps on a weekly or monthly basis, whether
the device really needs to be tested or not. Predictive maintenance takes into
consideration the device’s performance history; a device with a high degree of
drift between tests should be tested more frequently than a device with a very low
drift between tests.
Test scheduling plays an important role in maintaining a safe and efficient
operating environment. DPC/TRACK helps you manage your test scheduling
needs through three related fields: Due Date, Interval Value, and Interval
Units. When the results of a test are saved, the date that the test was performed is
saved in the Test Date field within the Test Results database. If specified, the
testing interval is added to the most recent Test Date to determine the value
within the Due Date field. (See Example 2.5.)
Consider the sample record SAMPLETAG2 (viewed via the Instrument View
screen). As you can see, the testing interval for this device is one month. The Due
Date value of 3/18/96 is based on the most recent test date for the device, which
was 2/18/96. To see the associated Test Results record, select the Tag ID History
tab. (Select the Done button to return to the Instrument View screen.)










