Brochure

Sensing & Inspection Technologies

phoenix|x-ray

phoenix diamond|window

Up to 2 times faster data acquisition at the same

high image quality level

Option for all phoenix|x-ray transmission

microfocus or high power nanofocus

X-ray tubes up to 180 kV / 20 W

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GE Sensing & Inspection Technologies phoenix|x-ray phoenix diamond|window Up to 2 times faster data acquisition at the same high image quality level Option for all phoenix|x-ray transmission microfocus or high power nanofocus X-ray tubes up to 180 kV / 20 W
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phoenix diamond|window high output with high resolution At higher applied power for X-ray generation, the focal spot has to be wider in order to prevent the target material from melting. Therefore, the inspection of small features with high absorbing materials using traditional transmission micro- or nanofocus tubes is limited either by power (almost no penetration resulting in noisy images or very long image acquisition time) or by resolution (increasing focal spot with power resulting in blurred images).