ii Warranty The Gentec-EO inc Holographic Beam Sampler carries a one year warranty (from date of shipment) against material and / or workmanship defects, when used under normal operating conditions. The warranty does not cover damages related to misuse. Gentec-EO inc will repair or replace, optionally, any product which proves to be defective during the warranty period, except in the case of product misuse.
iii TABLE OF CONTENTS WARRANTY .................................................................................................................................. ii TABLE OF CONTENTS ............................................................................................................... iii LIST OF ILLUSTRATIONS .......................................................................................................... iv 1 GENERAL INFORMATION...........................................................
iv LIST OF ILLUSTRATIONS Fig. 2-1 HBS Alignment .................................................................................................................. 6 Fig. 3-1a Cos narrowing effect ....................................................................................................... 8 Fig. 3-1b Camera setup .................................................................................................................. 8 Fig. 3-1c Second order used for beam profiling ......................
1 1 GENERAL INFORMATION 1.1 RECEPTION The Gentec-EO inc HBS equipment was delivered in good condition. Once the shipment is received, it should be immediately inspected for damage. The contents of all boxes should be unpacked carefully. Notify and file a claim with the carrier in the case of any loss or damage. All shipping boxes must be inspected by the carrier in order to file a claim. Send a purchase order to Gentec-EO inc in order to replace any parts damaged during shipment.
2 1.2 INTRODUCTION The HBS offers an unprecedented range of applications for users of both low and highlasers.
3 HBS STANDARD SPECIFICATIONS First Order 1/100 or 1/2000 of transmitted beam (Calibration accuracy = ± 3%) Second Order Characterization upon request Order Angles 1st = 10° 2nd = 20° Coating Anti reflection on both sides Insertion Loss (with AR coating) 0.3% per side (typical) HBS SUBSTRATES SUBSTRATE UV-Grade Fused Silica Zinc Selenide DIAMETER (inches) THICKNESS (inches) WEDGE 1" and 2" (+ 0/- .005") 1" (+ 0/- .005") 0.125" (+/- .005") 0.125" (+/- .005") 30 min. (+/- 10 min.
4 HBS CUSTOMIZED SPECIFICATIONS (call Gentec-EO inc for details) Gentec-EO inc HBS custom engineered models may contain any of the following specifications: - Wavelengths from 250 to nm to 14 µm. - Sampling factor from 1/10 to 1/2000 of transmitted energy and power on first order samples. - Any sampling angle for the first order samples (second order deviation angle will be twice as large as the angle chosen for the first order). - Substrates with or without wedge.
5 2 HBS SETUP AND ALIGNMENT Normal Incidence Setup The relation between the incidence angle upon the HBS and the angles where the secondary beams are diffracted is determined by the properties associated with the general theory on gratings. In order to obtain the specified secondary beams (angles, sampling ratio), it is recommended to place the HBS at normal incidence with respect to the beam to be sampled.
6 HBS Instruction Manual Revision 4.
7 3 BEAM PROFILING HBS for Beam Profiling Purposes In order to use the HBS for imaging a collimated beam, a special procedure is recommended. This setup is related to the fact that there exists a geometrical narrowing of the diffracted beam when viewed from a right angle in relation to its propagation direction. The beam will be slightly elliptical (see Fig. 3-1a ). The following equation should be used to correct the beam profiling: dm = do cos Erreur ! Signet non défini.
8 HBS Instruction Manual Revision 4.
9 4 MAINTENANCE In order to obtain maximum efficiency from the HBS, both surfaces must be kept clean and free of dust and/or oil. NEVER TOUCH SURFACES WITH BARE HANDS. Dust can be removed with a clean stream of air.
10 DAMAGE TO THE MATERIAL Damage to the material can be caused by using the HBS when the surface has been contaminated. Tests conducted at three different wavelengths (355 nm, 532 nm and 1.064 µm) by a major USGovernment-funded laboratory indicated that the HBS has the same damage threshold as the bare substrate itself. HBS Instruction Manual Revision 4.
