User's Manual

PR533_SDS All information provided in this document is subject to legal disclaimers. © NXP Semiconductors N.V. 2014. All rights reserved.
Product short data sheet
COMPANY PUBLIC
Rev. 3.6 — 27 October 2014
206436 12 of 36
NXP Semiconductors
PR533
USB NFC integrated reader solution
10.5 RSTPD_N input pin characteristics
10.6 Input pin characteristics for I0, I1 and TESTEN
[1] To minimize power consumption when in soft power-down mode, the limit is V
DDD
 0.4 V.
[2] To minimize power consumption when in soft power-down mode, the limit is 0.4 V.
[3] TESTEN should never be set to high level in the application. It is used for production test purpose only. It is
recommended to connect TESTEN to ground although there is a pull-down included.
Table 12. RSTPD_N input pin characteristics
Symbol Parameter Conditions Min Typ Max Unit
V
IH
HIGH-level input volt-
age
V
DD(PVDD)
0.4 - V
DD(PVDD)
V
V
IL
LOW-level input volt-
age
0-0.4V
I
IH
HIGH-level input cur-
rent
V
I
=V
DD(PVDD)
1-1A
I
IL
LOW-level input current V
I
= 0 V 1-1A
C
i
input capacitance - 2.5 - pF
Table 13. Input pin characteristics for I0, I1 and TESTEN
Symbol Parameter Conditions Min Typ Max Unit
V
IH
HIGH-level input voltage
[1]
0.7  V
DDD
-V
DDD
V
V
IL
LOW-level input voltage
[2]
00.3 V
DDD
V
I
IH
HIGH-level input current I0 and I1;
V
I
=V
DDD
[3]
1-1 A
I
IL
LOW-level input current V
I
=0V 1-1 A
C
i
input capacitance - 2.5 - pF