Report No.: BL-SZ2291101-901 TEST REPORT Applicant: GLAMCOR GLOBAL LLC Address: 110 Wall Street, 5th Floor, New York, NY1005, US Equipment Type: Multilayer Chip Antenna Model Name: 2450AT18A100E Brand Name: Johanson Technology Test Standard: ANSI/IEEE Std 149-1979 Test Date: Sep. 30, 2022 Date of Issue: Oct. 12, 2022 ISSUED BY: Shenzhen BALUN Technology Co., Ltd.
Report No.: BL-SZ2291101-901 Revision History Version Rev. 01 Issue Date Oct. 12, 2022 Revisions Initial Issue TABLE OF CONTENTS 1 2 3 4 GENERAL INFORMATION ........................................................................................................ 3 1.1 Test Laboratory ................................................................................................................... 3 1.2 Test Location..................................................................................
Report No.: BL-SZ2291101-901 1 GENERAL INFORMATION 1.1 Test Laboratory Name Shenzhen BALUN Technology Co., Ltd. Address Block B, 1/F, Baisha Science and Technology Park, Shahe Xi Road, Nanshan District, Shenzhen, Guangdong Province, P. R. China Phone Number +86 755 6685 0100 1.2 Test Location Name Location Shenzhen BALUN Technology Co., Ltd. Block B, 1/F, Baisha Science and Technology Park, Shahe Xi Road, Nanshan District, Shenzhen, Guangdong Province, P. R.
Report No.: BL-SZ2291101-901 2 PRODUCT INFORMATION 2.1 Applicant Information Applicant GLAMCOR GLOBAL LLC Address 110 Wall Street, 5th Floor, New York, NY1005, US 2.2 Manufacturer Information Manufacturer GLAMCOR GLOBAL LLC Address 110 Wall Street, 5th Floor, New York, NY1005, US 2.3 General Description for Equipment under Test (EUT) EUT Name Multilayer Chip Antenna Model Name Under Test 2450AT18A100E Antenna Type Dimensions Ceramic Antenna 3.2*1.6*1.3 mm 2.
Report No.: BL-SZ2291101-901 3 SUMMARY OF TEST RESULTS 3.1 Test Standards No. Identity Document Title 1 ANSI/IEEE Std 149-1979 IEEE Standard Test Procedures for Antennas 3.2 Test Verdict Report Section ANNEX A.1 ANNEX B Description Gain and Efficiency Radiation Pattern Remark --- 3.3 Test Uncertainty The uncertainty is calculated using the methods suggested in the "Guide to the Expression of Uncertainty in Measurement" (GUM) published by ISO. Item Uncertainty Gain ±1.
Report No.: BL-SZ2291101-901 4 GENERAL TEST CONFIGURATIONS 4.1 Test Condition Selected Values During Tests Environment Parameter Ambient Pressure(KPa) Temperature(℃) Voltage Relative Humidity (%) 101 25 N/A 50 Normal Temperature, Normal Voltage (NTNV) 4.2 Test Equipment List Description Manufacturer Model Serial No. Cal. Date Cal. Due SG24 Multi-probe Antenna Measurement System SATIMO SG24-L 11018550001 2021.11.12 2024.11.11 Vector Network Analyzer Agilent E5071B MY42404001 2022.
Report No.: BL-SZ2291101-901 4.3 Test Setup 4.3.1 Antenna gain, efficiency and radiation pattern test setup Tel: +86-755-66850100 E-mail: qc@baluntek.com Page No. 7 / 13 Web: www.titcgroup.com Template No.: TRP-Passive-EN (2022-09-07) Add: Block B, 1/F, Baisha Science and Technology Park, Shahe Xi Road, Nanshan District, Shenzhen, Guangdong Province, P. R.
Report No.: BL-SZ2291101-901 ANNEX A TEST RESULTS A.1 Gain and Efficiency Frequency Gain (dBi) Efficiency (%) 2400MHz 0.41 27 2410MHz 0.32 27 2420MHz 0.19 26 2430MHz 0.15 26 2440MHz 0.06 25 2450MHz -0.11 25 2460MHz -0.50 24 2470MHz -0.73 24 2480MHz -0.89 23 2490MHz -1.24 22 2500MHz -1.64 21 Tel: +86-755-66850100 E-mail: qc@baluntek.com Page No. 8 / 13 Web: www.titcgroup.com Template No.
Report No.: BL-SZ2291101-901 ANNEX B RADIATION PATTERN B.1 3D Pattern B1.1 3D Pattern for 2400MHz B1.2 3D Pattern for 2450MHz Tel: +86-755-66850100 E-mail: qc@baluntek.com Page No. 9 / 13 Web: www.titcgroup.com Template No.: TRP-Passive-EN (2022-09-07) Add: Block B, 1/F, Baisha Science and Technology Park, Shahe Xi Road, Nanshan District, Shenzhen, Guangdong Province, P. R.
Report No.: BL-SZ2291101-901 B1.3 3D Pattern for 2500MHz Tel: +86-755-66850100 E-mail: qc@baluntek.com Page No. 10 / 13 Web: www.titcgroup.com Template No.: TRP-Passive-EN (2022-09-07) Add: Block B, 1/F, Baisha Science and Technology Park, Shahe Xi Road, Nanshan District, Shenzhen, Guangdong Province, P. R.
Report No.: BL-SZ2291101-901 B.2 1D Radiation Pattern B2.1 PHI=0 B2.2 PHI=90 B2.3 THETA=90 Tel: +86-755-66850100 E-mail: qc@baluntek.com Page No. 11 / 13 Web: www.titcgroup.com Template No.: TRP-Passive-EN (2022-09-07) Add: Block B, 1/F, Baisha Science and Technology Park, Shahe Xi Road, Nanshan District, Shenzhen, Guangdong Province, P. R.
Report No.: BL-SZ2291101-901 ANNEX C TEST SETUP PHOTOS Please refer the document “BL-SZ2291101-AO.PDF”. ANNEX D EUT PHOTO Please refer the document “BL-SZ2291101-AA.PDF”. Tel: +86-755-66850100 E-mail: qc@baluntek.com Page No. 12 / 13 Web: www.titcgroup.com Template No.: TRP-Passive-EN (2022-09-07) Add: Block B, 1/F, Baisha Science and Technology Park, Shahe Xi Road, Nanshan District, Shenzhen, Guangdong Province, P. R.
Report No.: BL-SZ2291101-901 Statement 1. The laboratory guarantees the scientificity, accuracy and impartiality of the test, and is responsible for all the information in the report, except the information provided by the customer. The customer is responsible for the impact of the information provided on the validity of the results. 2. The report without China inspection body and laboratory Mandatory Approval (CMA) mark has no effect of proving to the society. 3.
