Datasheet
SECUTEST BASE / PRO and SECULIFE ST BASE(25)
Test Instruments for
Measuring
Electrical Safety of Devices
6 GMC-I Messtechnik GmbH
1
Specified values are only valid for the display at the test instrument. Data transmit-
ted via the USB port may deviate from these values.
2
Known as equivalent leakage current or equivalent patient leakage current from previous standards
3
Protective conductor current, touch current, device leakage current, patient leakage current
4
Protective conductor current, touch current, device leakage current
5
Only with SECUTEST BASE10 (Feature AA02), SECUTEST PRO and SECULIFE ST BASE
6
Only with SECUTEST PRO (Feature I01) and SECULIFE ST BASE
7
Measurement type IPE clamp and IG clamp
8
Measurement type IPE AT3 adapter and IG AT3 adapter
9
The measuring range upper limit depends on the selected test voltage.
10
Due to inrush current limiting components, the voltage at the test socket may be
lower than the measured line voltage.
11)
only with SECULIFE ST BASE25
Key: rdg. = reading (measured value), d = digit(s)
Test Times, Automated Sequence
The test times (parameter „Measurement duration ...“) can be adjusted
in the sequence parameter setting menu for each rotary switch posi-
tion separately. The test times are not tested and calibrated.
Emergency Shutdown During Leakage Current Measurement
As of 10 mA of differential current (can also be set to 30 mA), automatic
shutdown ensues within 100 ms. This shutdown is not effected during
leakage current measurement with clamp or adapter.
Influencing Quantities and Influence Error
I
Clamp
Current via
current clamp
sensor
[1 mV : 1 mA]
(V–COM sockets
67
)
1 ... 99 mA
1mA
(1 mV)
— — ———— —
±(2 % rdg.+2 d)
>10d
20 Hz ... 20 kHz
without clamp
253 V Cont.
0.1 ... 0.99 A
0.01 A
(10 mV)
1.0 ... 9.9 A
0.1 A
(100 mV)
10 ... 300 A
1A
(1 V)
Current via
current clamp
sensor
[10mV : 1mA]
(V–COM sockets
67
)
0.1 ... 9.9 mA
0.1 mA
(1 mV)
— — ———— —
10 ... 99 mA
1mA
(10 mV)
0.10 ... 0.99 A
0.01 A
(100 mV)
1.0 ... 30.0 A
0.1 A
(1 V)
Current via
current clamp
sensor
[100 mV : 1 mA]
(V–COM sockets
67
)
0.01 ... 0.99 mA
0.01 mA
(1 mV)
— — ———— —
1.0 ... 9.9 mA
0.1 mA
(10 mV)
10 ... 99 mA
1mA
(100 mV)
0.10 ... 3.00 A
0.01 A
(1 V)
Current via
current clamp
sensor
[1000 mV : 1 mA]
(V–COM sockets
67
)
1 ... 99 μA
1μA
(1 mV)
— — ———— —
0.10 ... 0.99 mA
0.01 mA
(10 mV)
1.0 ... 9.9 mA
0.1 mA
(100 mV)
10 ... 300 mA
1mA
(1 V)
Func-
tion
Measured
Quantity
Display Range /
Nominal Range of
Use
Reso-
lution
Nominal
Voltage
U
N
Open-
Circuit
Voltage
U
0
Nom.
Current
I
N
Short-
Circuit
Current
I
K
Inter-
nal
Resis-
tance
R
I
Refer-
ence
Resis-
tance
R
REF
Measuring
Uncertainty
1
Intrinsic Error
1
Overload
Capacity
Value Time
Influencing Quantity /
Sphere of Influence
Designation
per
IEC 61557-16
Influence Error
± … % rdg.
Change of position E1 —
Change to test equipment supply
voltage
E2 2.5
Temperature fluctuation
E3
Specified influence error valid
starting with temperature changes
as of 10 K:
0 … 40
°C2.5
Amount of current at DUT E4 2.5
Low frequency magnetic fields E5 2.5
DUT impedance E6 2.5
Capacitance during insulation mea-
surement
E7 2.5
Waveform of measured current
E8
49 … 51 Hz
2 with capacitive load (for equiva-
lent leakage current)
45 … 100 Hz 1 (for touch current)
2.5 for all other measuring ranges