Specifications

SKI.WB800D.2
QR-ZZPJ-017A
14
10-8
Low
temperatur
e storage
test
Leave the samples in
-25±3℃@24 hours
3
Leave samples in standard test condition
for 2 hours then test, the Appearance,
Power, EVM and Frequency error shall be
satisfied with the test specification.
10-9
Low
temperatur
e load test
Leave samples in -15±3℃@ 2
hours, samples’ function shall
be normal, the let samples
work for 1 hour
3
After test, leave the samples in standard
condition and tested the Appearance,
Power, EVM and Frequency error shall be
satisfied with the test specification.
10-10
Temperatu
re circle
test
One cycle duration
-10±3℃@3H
40±3℃ @3H
Total cycle: 10x
3
After test, leave the samples in standard
condition and tested Power EVM and
Frequency error shall be qualified and all
the characters shall be satisfied with the
test specification.
10-11
Continuous
TP test
Twice cycle duration
-10±3℃@4H
+60±3℃@4H,
+25@2H@2H
3
During test, There will not been appeared
signal disconnection or interruption
between DUT and AP.
10-12 ESD
Discharge voltage: 1kV
C: 150pF
Discharge resistance：330Ω
Positive10 times
1 time for each second
3
The products can recoverable smoothly
after ESD test.