Data Sheet

GPT 12000CD1DH-
Specifications subject to change without notice.
TF+1-909-399-3535 [phone]
TF+604-6111122 [phone]
U.S.A. Subsidiary
INSTEK AMERICA CORP.
Japan Subsidiary
TEXIO TECHNOLOGY CORPORATION.
Korea Subsidiary
TF+82-2-3439-2205 [phone]
GOOD WILL INSTRUMENT KOREA CO., LTD.
TF+81-45-620-2305 [phone]
GOOD WILL INSTRUMENT CO., LTD.
Global Headquarters
TF+886-2-2268-0389 [phone]
China Subsidiary
Malaysia Subsidiary
GOOD WILL INSTRUMENT (SEA) SDN. BHD.
GOOD WILL INSTRUMENT (SUZHOU) CO., LTD.
TF+86-512-6661-7177 [phone]
GOOD WILL INSTRUMENT EURO B.V.
TF+31(0)40-2557790 [phone]
Europe Subsidiary
Simply Reliable
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AC WITHSTANDING
Output-Voltage Range
Output-Voltage Resolution
Output-Voltage Accuracy
Maximum Rated Load
Maximum Rated Current
Output-Voltage Waveform
Output-Voltage Frequency
Voltage Regulation
Voltmeter Accuracy
Current Measurement Range
Current Best Resolution
Current Measurement Accuracy
Window Comparator Method
ARC Detect
RAMP UP (Rise Time)
RAMP DOWN (Fall Time)
TIMER (Test Time)
WAIT TIME
GND
DC WITHSTANDING
Output-Voltage Range
Output-Voltage Resolution
Output-Voltage Accuracy
Maximum Rated Load
Maximum Rated Current
Voltage Regulation
Voltmeter Accuracy
Current Measurement Range
Current Best Resolution
Current Measurement Accuracy
Window Comparator Method
ARC Detect
RAMP UP (Rise Time)
RAMP DOWN (Fall Time)
TIMER (Test Time)
WAIT TIME
GND
INSULATION RESISTANCE
Output Voltage
Output-Voltage Resolution
Output-Voltage Accuracy
Resistance Measurement
Voltage Regulation
Voltmeter Accuracy
Short-Circuit Current
Output Impedance
Window Comparator Method
RAMP UP (Rise Time)
RAMP DOWN (Fall Time)
TIMER (Test Time)
WAIT TIME
GND
GROUND BOND
Output-Current
Output-Current Resolution
Output-Current Accuracy
Test-Voltage
Test-Voltage Frequency
Ohmmeter Measurement Range
Ohmmeter Measurement Resolution
Ohmmeter Measurement Accuracy
Window Comparator Method
TIMER (Test Time)
Test Method
GND
CONTINUITY TEST
Output-Current
Ohmmeter Measurement Range
Ohmmeter Measurement Resolution
Ohmmeter Measurement Accuracy
MEMORY
Single Step Memory
Automatic Testing Memory
INTERFACE
REMOTE, USB host
Rear Output, RS-232C, USB device, SCAN terminal, Signal I/O,
GPIB
DISPLAY
POWER SOURCE
DIMENSION & WEIGHT
0.050kV~5.000kV
1V
±(1% of setting + 5V) [no load]
200 VA (5kV/40mA)
40mA (0.5kV< V 5kV); 10mA (0.05kV V 0.5kV)≦≦≦
Sine wave
50 Hz / 60 Hz selectable
±(1% + 5V) [maximum rated load -- no load]
±(1% of reading + 5V)
1 A~40.00mAμ
1 A / 10 Aμμ
±(1.5% of reading + 30 A)μ
Yes
Yes
0.1s~999.9s
0.0s~999.9s
OFF, 0.3s~999.9s
0.0s~999.9s
ON/OFF
0.050kV~6.000kV
1V
±(1% of setting + 5V) [no load]
50W (5kV/10mA)
10mA (0.5kV< V 6kV);≦
2mA (0.05kV V 0.5kV)≦≦
±(1% + 5V) [maximum rated load -- no load]
±(1% of reading + 5V)
1 A~10.00mAμ
0.1 A /1 A /10 Aμμ μ
±(1.5% of reading + 3 A) when I Reading < 1mA ;μ
±(1.5% of reading + 30 A) when I Reading 1mAμ
Yes
Yes
0.1s~999.9s
0.0s~999.9s
OFF, 0.3s~999.9s
0.0s~999.9s
ON/OFF
50V~1200V dc
50V
±(1% of setting + 5V) [no load]
Test Voltage
Display Range
50V V 100V≦≦ 0.1MΩ~ 10.00GΩ
150V V 450V≦≦ 0.1MΩ~ 20.00GΩ
500V V 1200V≦≦ 0.1MΩ~ 50.00GΩ
Measurement Range / Accuracy
0.1M 1M 5% of reading + 3 count);Ω~ Ω：±(
1 M 50M 5% of reading + 1 count);Ω~ Ω：±(
51M 2G 10% of reading + 1 count)Ω~ Ω：±(
0.1M 1M 5% of reading + 3 count);Ω~ Ω：±( 1 M 500M 5% of reading + 1 count);Ω~ Ω：±(
501M 9.999G 10% of reading + 1 count);Ω~ Ω：±(
10G 50G 20% of reading + 1 count)Ω~ Ω：±(
±(1% + 5V) [maximum rated load -- no load]
±(1% of reading + 5V)
10mA max.
2kΩ
Yes
0.1s~999.9s
0.0s~999.9s
0.3s~999.9s
0.0s~999.9s
ON/OFF
03.00A~32.00A ac
0.01A
3A I 8A : ±(1% of reading + 0.2A);≦≦ 8A<I 32A : ±(1% of reading + 0.05A)≦
8Vac max (open circuit)
50Hz/60Hz selectable
1m ~ 650mΩΩ
0.1mΩ
±(1% of reading + 2 m )Ω
Yes
0.3s~999.9s
Four Terminal
ON/OFF
100mA dc (fixed)
0.10 ~ 90.00ΩΩ
0.01Ω
±(10% of reading + 2 m )Ω
MANU : 100 blocks
AUTO : 100 blocks, Manu per auto : 10
Standard (Front)
Standard (Rear)
Option
7” color LCD
AC 100V~240V ± 10%, 50Hz/60Hz
380(W) x 148(H) x 454(D) mm; Approx. 15kg
≦
SPECIFICATIONS