GKT-008 EMI Near Field Probe USER MANUAL GW INSTEK PART NO.
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TABLE OF CONTENTS Table of Contents SAFETY INSTRUCTIONS .................................. 2 MAIN FEATURES ............................................. 3 High Sensitivity ................................................................... 3 Ultra-Low Directionality ....................................................... 5 Good Far Field Frequency Response .................................. 10 EMI NEAR FIELD PROBE USES ...................... 11 Magnetic Field Probe ........................................
GKT-008 EMI Near Field Probe User Manual SAFETY INSTRUCTIONS Read the following before any operation to ensure your safety and to keep the device in the best condition. Safety Symbols These safety symbols may appear in this manual or on the device.
MAIN FEATURES MAIN FEATURES High Sensitivity The GKT-008 probe has a high sensitivity to quickly analyze a source of noise. The probe can be used with the dedicated EMI Pretest function on the GW Instek GSP-9300 spectrum analyzer. When used with the default pre-amplifier function, the sensitivity of the EMI probe can be significantly enhanced to distinguish subtle noise.
GKT-008 EMI Near Field Probe User Manual Test Results from the GKT-008 Probe 4
MAIN FEATURES Ultra-Low Directionality Typically the design of near field ring probes cause measurement results to vary greatly when using the probes in a horizontal or vertical orientation. This often leads to incorrectly diagnosing a source of noise and therefore nullifying any corrective action.
GKT-008 EMI Near Field Probe User Manual Measurement Differences in the Horizontal and Vertical Orientation of General Ring Probes(Case 2) 6
MAIN FEATURES 7
GKT-008 EMI Near Field Probe User Manual Small Measurement Differences in the Horizontal and Vertical Orientation When Using the GKT-008 8
MAIN FEATURES 9
GKT-008 EMI Near Field Probe User Manual Good Far Field Frequency Response In general, test specifications are limited to 3M far field tests, but with tests performed using EMI probes to measure the near field electromagnetic field. However, the frequency response between far field & near field electromagnetic fields differ greatly, and thus when EMI near field probes are used to diagnose far field noise problems, test results can cause false positives and other misdiagnoses.
EMI NEAR FIELD PROBE USES EMI NEAR FIELD PROBE USES Magnetic Field Probe The magnetic field probe can analyze and diagnose the problems listed below: Spatial noise of the device and equipment Spatial noise of PCB boards PCB trace and component radiated noise Cable and wire radiated noise Confirmation of shielding effectiveness 11
GKT-008 EMI Near Field Probe User Manual Electric Field Probe The electric field probe can analyze and diagnose the problems listed below: 12 Ground and power noise PCB trace conducted noise IC pin output noise I/O pin output noise Confirmation of filter effectiveness
EMI NEAR FIELD PROBE USES AC Voltage Probe The AC voltage probe can analyze and diagnose the problems listed below: AC conducted Noise Switching power supply noise and component noise 13
GKT-008 EMI Near Field Probe User Manual APPLICATIONS This probe set should be used with GW Instek spectrum analyzers. When used in conjunction with the analyzer’s built-in application functions (EMI pretest and EMS Debug), the probes are able to diagnose EMI near field problems, estimate far fields as well as diagnose and analyze EMS. When the EMC pretest button on the GSP-9300 is selected, the EMC mode will appear on the screen, and five common EMC functions will become available to select from.
APPLICATIONS 15
GKT-008 EMI Near Field Probe User Manual EMI Test When the EMI test soft-key is selected, different test frequency bands will appear on the right of the screen. Select the desired test frequency band according to the EMI test requirements. If the desired test frequency band doesn’t appear on the screen, you can manually set the Start and Stop frequencies yourself.
APPLICATIONS EMI M probe When you need to diagnose the energy distribution and source of spatial noise in products, the EMI probe as shown in the photo below can be used. Note The measurement category and corresponding maximum measurement voltage for the ANT-04 or ANT-05 probe is CAT I 50Vdc. They can’t be used for other measurement categories other than CAT I. There are two EMI probe sizes in this probe set.
GKT-008 EMI Near Field Probe User Manual measure small areas of radiated emissions from IC components. Both probes have the same features for near field measurement. When the EMI probe soft-key is selected, three commonly used frequency bands appear on the right of the screen. Select the desired frequency band according to the needs of the test. At this time you can sweep each area or each component one at a time to test for the highest sources of noise in the test product.
APPLICATIONS 19
GKT-008 EMI Near Field Probe User Manual EMI Eprobe When you need to know the energy distribution and the source of noise in the PCB traces, power, ground or component pin conductors, you can use an electric field probe as shown below: Note The measurement category and corresponding maximum measurement voltage for the PR-02 probe is CAT I 50Vdc. It can’t be used in other measurement categories other than CAT I.
APPLICATIONS When the EMI EProbe soft-key is selected, two frequency bands will appear on the right of the screen for selection. Select a frequency band according the frequency of the noise to be analyzed. Touch the points to be measured and accessed, such as different ground points on the PCB board, with the tip of the electric field probe.
GKT-008 EMI Near Field Probe User Manual Turn Correction On If PCB trace Pin is selected, select the parameter which best matches the trace length.
APPLICATIONS Voltage Probe There is also an AC Voltage Probe in the GKT-008 probe set, shown in the photo below, which can be used as an effective and rapid tool for diagnosing and analyzing AC power conduction noise. Note Note The measurement category and corresponding maximum measurement voltage for the PR-01 probe is CAT I/CAT II 300Vac.
GKT-008 EMI Near Field Probe User Manual Transient limiter GPL-5010 Two kinds of axes are available 24
APPLICATIONS EMS Test If the probe is used with the GSP-9300’s tracking generator, it allows you to perform debugging and diagnosis of EMS. The magnetic or electric field probe is connected to the TG (tracking generator) Output terminal of the spectrum analyzer. Select EMS Test and then select the desired EMS diagnostic frequency range.
GKT-008 EMI Near Field Probe User Manual SPECIFICATIONS PR-01 Frequency Range 150 kHz to 30 MHz Primary Sensor E-field Insertion Loss S21 / Frequency Response 5 dB / -3.6 dB (Avg.) Deviation of Insertion Loss S21 ± 1 dB Connector 50 Ω (SMA) Input Resistance 10 MΩ Rated Voltage 300 VAC PR-02 Frequency Range 30 MHz to 3 GHz Primary Sensor E-field Insertion Loss S21 / Frequency Response 10 dB / -13.5 dB (Avg.
SPECIFICATIONS ANT-04 Frequency Range 30 MHz to 3 GHz Primary Sensor H-field Correction Factor / Frequency Response 10 dB / -26.5 dB (Avg.) Deviation of Correction Factor ± 4 dB Connector 50 Ω (SMA) Maximum Input Power 0.5 W ANT-05 Frequency Range 30 MHz to 3 GHz Primary Sensor H-field Correction Factor / Frequency Response 10 dB / -26.5 dB (Avg.) Deviation of Correction Factor ± 4 dB Connector 50 Ω (SMA) Maximum Input Power 0.
GKT-008 EMI Near Field Probe User Manual Declaration of Conformity We GOOD WILL INSTRUMENT CO., LTD. declare that the below mentioned product Type of Product: EMI Probe Kit Set Model Number: GKT-008 (PR-01, PR-02, ANT-04, ANT-05) are herewith confirmed to comply with the requirements set out in the Council Directive on the Approximation of the Law of Member States relating to the EMC: 2014/30/EU, WEEE: 2012/19/EU and RoHS: 2011/65/EU.
