User manual

Hitachi hard disk drive specifications
209
11.42.2 Device Attributes Data Structure
The following defines the 512 bytes that make up the Attribute Value information. This data structure is
accessed by the host in its entirety using the SMART Read Attribute Values subcommand. All multi-byte fields
shown in these data structures are in byte ordering, namely that the least significant byte occupies the lowest
numbered byte address location in the field.
Description
Bytes
Offset
Value
Data Structure Revision Number
2
00h
0010h
1
st
Device Attribute
12
02h
…
..
…
..
30
th
Device Attribute
12
15Eh
Off-line data collection status
1
16Ah
Self-test execution status
1
16Bh
Total time in seconds to complete off-line data collection activity
2
16Ch
Vender specific
1
16Eh
Off-line data collection capability
1
16Fh
1Bh
SMART capability
2
170h
0003h
SMART device error logging capability
1
172h
01h
Self-test failure check point
1
173h
Short self-test completion time in minutes
1
174h
Extended self-test completion time in minutes. If 0FFh, use bytes 177h and 178h for
completion time.
1
175h
Reserved
1
176h
Extended self-test completion time in minutes. (word)
2
177h
Reserved
9
179h
Vendor specific
125
182h
Data structure checksum
1
1FFh
512
Table 151 Device Attribute Data Structure
11.42.2.1 Data Structure Revision Number
The Data Structure Revision Number identifies which version of this data structure is implemented by the device.
This revision number identifies both the Attribute Value and Attribute Threshold Data structures.