Brocade Fabric OS Command Reference Manual - Supporting Fabric OS v5.3.0 (53-1000436-01, June 2007)

Fabric OS Command Reference Manual 61

53-1000436-01

centralMemoryTest

Chip Number Error Subtest

The forced bad chip number error subtest verifies that the bad buffer number in the data packet

can be detected and its error flag and interrupt bits set.

The test method is as follows:

Clear the error and interrupt bits of all ASICs.

Set up the hardware so that transmission of data includes a bad buffer.

For each of the 11 possible offsets for each ASIC X in the switch:

Write a 64-byte pattern in the central memory.

Read X from all ASIC Y in the switch.

For all ASIC Y, ensure:

interrupt status bits set.

the error type is chip number error.

the port number in error is the receiver port (which is the base port of ASIC Y).

Reading the error register clears the CMEM interrupt bit, preparing for the next offset to test.

Operands This command has the following operands:

--slot slotnumber Specify the slot number on which the diagnostic will operate. The ports

specified will be relative to this slot number. The default is set to 0 and

designed to operate on fixed port-count products.

-passcnt count Specify the number of test passes to run. By default, the test runs one time.

-datatype type Specify the type of data pattern to use. By default, type 9, QUAD_RAMP, is

used. For a complete list of supported data patterns, run the dataTypeShow

command. Some common settings are:

1 BYTE_FILL pattern

2 WORD_FILL pattern

3 QUAD_FILL pattern

9 QUAD_RAMP (Addr=Data) pattern

11 RANDOM pattern

-ports itemlist Specify a list of blade ports to test. The Ports list is translated into a matching

Quad list before the test is run. By default, all the blade ports in the specified

slot (--slot) are tested. Refer to itemList for more information.

-seed value Specify the data pattern seed to be used. The default seed value is 0.

Examples To test the ASIC central memory:

switch:admin> centralmemorytest -ports 1/0-1/15

Running centralmemorytest ............

Test Complete: centralmemorytest Pass 1 of 1

Duration 0 hr, 0 min & 3 sec (0:0:3:158).

passed.