Software Manual

DLT, DLT1, VS80, VS160, and SDLT Assessment tests performed:
• SCSI interconnect test
• Review event log entries (that were present prior to running this test)
• Load the test tape
• Quick write/read test
• Soft unload/load test (DLT assessment test only)
• Minimum block size test
• Diagnostic self test (built-in drive function)
• Read/write tests, using various data patterns
• Bit error rate test
• Review new event log entries added during the test
• Unload the test tape
LTO Assessment tests performed:
• Requires that a cartridge be already loaded or in the process of
loading when the test is started.
• Looks at drive history (runs device analysis and looks at LTO reports
information).
• Checks the test cartridge history to insure it is suitable for running
the test.
• Checks whether the drive is requesting cleaning.
• Performs an unload/load cycle, checking for any mechanical issues
• Writes two wraps of data using varying tape speeds in both
directions measuring write and read-while-write margin
NOTE: The LTO Assessment test is updated for L&TT 4.2 SR1 to use
low I/O commands so the test can be performed using a slow host, such
as a laptop computer.
NOTE: If the drive to be tested in part of an autoloader or library, the
autoloader or library should be in random mode prior to running the
test.
DDS Assessment tests performed:
NOTE: L&TT versions 4.8 and above have two versions of the DDS
Assessment test. L&TT will offer the test applicable to your tape drive.
Original test
• Review event log entries (that were present prior to running this test)
• Check life data in the serial EEPROM and the fault log
• Load check
• Perform a clean and write test
• Unload check
• MRS switch test
Diagnostic tests 101